CNS |
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General No. |
CNS 13623 |
Classified No. |
C6359 |
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法(范德普法) |
Date of Approval
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Bureau of Standards,
Metrology and Inspection |
Date of
Revision
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"CNS 13623" standard !
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CNS
Standard Code |
CNS 13623 |
CNS Standard Classified No. |
C6359 |
CNS Standard English Title |
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) |
CNS Standard Chinese Title |
單晶片之電阻率、霍爾係數及霍爾移動率之測定法(范德普法) |
CNS Standard Edition |
12/21/1995 |
CNS Standard Pages |
8 |
English Translation Price |
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