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CNS |
|
General No. |
CNS 13781 |
| Classified No. |
C6376 |
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
Date of Approval
|
Bureau of Standards,
Metrology and Inspection |
Date of
Revision
|
|
|
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"CNS 13781" standard !
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|
 |
| CNS
Standard Code |
CNS 13781 |
| CNS Standard Classified No. |
C6376 |
|
CNS Standard English Title |
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) |
|
CNS Standard Chinese Title |
自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
|
CNS Standard Edition |
10/30/1996 |
|
CNS Standard Pages |
1 |
| English Translation Price |
$***.00 USD |
|
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