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2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days . |
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CNS 12865-9
- English Version Method of Test for Digital Microelectronics ( Delay Measurements ) 數位微電子檢驗法（延遲量測） - 英文版 |
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CNS 12865-8
- English Version Method of Test for Digital Microelectronics ( Load Condition ) 數位微電子檢驗法（負載條件） - 英文版 |
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CNS 12865-7
- English Version Method of Test for Digital Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法（驅動源，動態） - 英文版 |
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CNS 12865-5
- English Version Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法（輸出端短路電流） - 英文版 |
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CNS 12865-3
- English Version Method of Test for Digital Microelectronics ( Low Level Input Current ) 數位微電子檢驗法（低位準輸入電流） - 英文版 |
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CNS 12865-2
- English Version Method of Test for Digital Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法（低位準輸出電壓） - 英文版 |
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CNS 12865-1
- English Version Method of Test for Digital Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法（高位準輸出電壓） - 英文版 |
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CNS 12712
- English Version Sampling Rate and Source Encoding for Professional Digital Audio Recording 專業性數位化聲頻記錄之取樣率及音源編碼 - 英文版 |
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CNS 12079
- English Version Method of Test for Digital Voltmeters 數字電壓計檢驗法 - 英文版 |
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CNS 4712
- English Version Method of Test for Digital Electronic Watches 數字電子錶檢驗法 - 英文版 |
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CNS 12865-6
- English Version Method of Test for Digital Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法（端子電容值） - 英文版 |
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