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CNS 12865-9
- English Version Method of Test for Digital Microelectronics ( Delay Measurements ) 數位微電子檢驗法(延遲量測) - 英文版 |
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CNS 12865-8
- English Version Method of Test for Digital Microelectronics ( Load Condition ) 數位微電子檢驗法(負載條件) - 英文版 |
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CNS 12865-7
- English Version Method of Test for Digital Microelectronics ( Drive Source, Dynamic ) 數位微電子檢驗法(驅動源,動態) - 英文版 |
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CNS 12865-5
- English Version Method of Test for Digital Microelectronics ( Output Short Circuit Current ) 數位微電子檢驗法(輸出端短路電流) - 英文版 |
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CNS 12865-3
- English Version Method of Test for Digital Microelectronics ( Low Level Input Current ) 數位微電子檢驗法(低位準輸入電流) - 英文版 |
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CNS 12865-2
- English Version Method of Test for Digital Microelectronics ( Low Level Output Voltage ) 數位微電子檢驗法(低位準輸出電壓) - 英文版 |
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CNS 12865-1
- English Version Method of Test for Digital Microelectronics ( High Level Output Voltage ) 數位微電子檢驗法(高位準輸出電壓) - 英文版 |
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CNS 12712
- English Version Sampling Rate and Source Encoding for Professional Digital Audio Recording 專業性數位化聲頻記錄之取樣率及音源編碼 - 英文版 |
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CNS 12079
- English Version Method of Test for Digital Voltmeters 數字電壓計檢驗法 - 英文版 |
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CNS 4712
- English Version Method of Test for Digital Electronic Watches 數字電子錶檢驗法 - 英文版 |
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CNS 12865-6
- English Version Method of Test for Digital Microelectronics ( Terminal Capacitance ) 數位微電子檢驗法(端子電容值) - 英文版 |
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