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2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days . |
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CNS 6127
- English Version General Rules for Reliability Assured Discrete Semiconductor Devices 可靠度保證單件半導體裝置總則 - 英文版 |
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CNS 13623
- English Version Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率 霍爾係數及霍爾移動率之測定法（範德普法） - 英文版 |
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CNS 11900
- English Version Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor) 電子設備用陶瓷固定電容器（半導體） - 英文版 |
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CNS 15187-4
- English Version Low - voltage fuses - Part 4: Supplementary requirements for fuse - links for the protection of Semiconductor devices 低壓熔線－第4部︰半導體裝置保護用熔線鏈之補充規定 - 英文版 |
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CNS 15187-4-1
- English Version Low-voltage fuses - Part 4-1 : Supplementary requirements for fuses-links for the protection of Semiconductor devices - Sections I 低壓熔線－第4－1部︰半導體裝置保護用熔線鏈之補充規定－第i章至第iii章︰經標準化之熔線鏈各種類型範例 - 英文版 |
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CNS 13805
- English Version Method of measurement for photoluminescence of optoelectronic Semiconductor wafers 光電半導體晶圓之光鐳射譜量測法 - 英文版 |
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CNS 13802-5
- English Version Graphical Symbols for Diagrams (Semiconductors and Electron Tubes) 電機工程製圖符號（半導體及電子管） - 英文版 |
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CNS 6137
- English Version Color Coding of Discrete Semiconductor Devices 個別半導體元件之色碼 - 英文版 |
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