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NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
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GB/T 29507-2013
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Test method for measuring flatness, thickness and total thickness variation on silicon wafers by automated non-contact scanning |
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Issued Date: |
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Implemented Date: |
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Issued by: |
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The Standardization Administration of the People's Republic of China |
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"GB/T 29507-2013" standard !
This GB standard english version is not ready translated, only after get your order, then we translate it, time usually need more 3-5 days .
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GB Standard Code |
GB/T 29507-2013 |
Standard Category |
China National Standards |
GB Standard English Title |
Test method for measuring flatness, thickness and total thickness variation on silicon wafers by automated non-contact scanning |
GB Standard Chinese Title |
硅片平整度、厚度及总厚度变化测试 自动非接触扫描法 |
Chinese Version Price |
$15 USD per 50 pages |
English Translation Fee |
About $15 per 1 page (1,000 words) |
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