“Integrated circuit c ” 中國GB標準檢索結果 |
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1. 已翻譯的GB標準英文版（有 SALE
標誌的），以及GB標準中文版，可以直接在網站上購買，在收到您付款後，會在1～3天內發您郵箱。 2. 其他未翻譯的GB標準英文版，在接到您翻譯訂單後，才進行翻譯，時間一般需要多3～5天。 |
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GB/T 43931-2024 （中英文版） General specifications for microwave integrated circuit chips for aerospace use |
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GB/T 43863-2024 （中英文版） Large-scale integrated circuits (LSI)-Package-Printed Circuit Board Common Design Structure |
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GB/T 43972-2024 （中英文版） Remote operation and maintenance of integrated circuit packaging equipment - state monitoring |
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GB/T 43748-2024 （中英文版） Microbeam analysis-Transmission electron microscopy-Method for determination of thickness of functional thin film layers in integrated circuit chips |
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GB/T 43796-2024 （中英文版） Remote operation and maintenance of integrated circuit packaging equipment-Data collection |
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GB/T 43538-2023 （中英文版） Quality technical requirements for integrated circuit metal packaging casing |
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GB/T 43536.2-2023 （中英文版） Three-dimensional integrated circuits Part 2: Calibration requirements for fine-pitch stacked chips |
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GB/T 43536.1-2023 （中英文版） Three-dimensional integrated circuits Part 1: Terms and definitions |
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GB/T 43454-2023 （中英文版） Integrated circuit intellectual property (IP) core design requirements |
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GB/T 28511.2-2023 （中英文版） Planar optical waveguide integrated optical circuit devices Part 2: Dense wavelength division multiplexing (DWDM) filters based on arrayed waveguide grating (AWG) technology |
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GB/Z 43510-2023 （中英文版） Guide to Reliability Test Methods for Integrated Circuit TSV Three-Dimensional Packages |
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GB/T 43228-2023 （中英文版） Design requirements for radiation-hardened integrated circuit unit libraries for aerospace use |
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GB/T 43227-2023 （中英文版） Test method for vapor-deposited protective films for inner leads of integrated circuits for aerospace use |
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GB/T 43226-2023 （中英文版） Single-event soft error time domain testing method for semiconductor integrated circuits used in aerospace applications |
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GB/T 43063-2023 （中英文版） Integrated circuit CMOS image sensor test method |
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GB/T 43061-2023 （中英文版） Semiconductor integrated circuit PWM controller test method |
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GB/T 43041-2023 （中英文版） Hybrid integrated circuit DC/DC converter |
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GB/T 43040-2023 （中英文版） Semiconductor integrated circuit AC/DC converter test method |
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GB/T 43035-2023 （中英文版） Semiconductor Devices Integrated Circuits Part 20: General Specifications for Film Integrated Circuits and Hybrid Film Integrated Circuits Part 1: Internal Visual Inspection Requirements |
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GB/T 43034.3-2023 （中英文版） Integrated circuits - Measurement of pulse immunity - Part 3: Non-synchronous transient injection method |
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GB/T 42975-2023 （中英文版） Semiconductor integrated circuit driver test methods |
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GB/T 42974-2023 （中英文版） Semiconductor integrated circuit flash memory (FLASH) |
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GB/T 42973-2023 （中英文版） Semiconductor integrated circuit Digital-to-analog (DA) converter |
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GB/T 42970-2023 （中英文版） Semiconductor integrated circuit video encoding and decoding circuit testing method |
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GB/T 42968.8-2023 （中英文版） Integrated circuits - Electromagnetic immunity measurements - Part 8: Radiated immunity measurements - IC stripline method |
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GB/T 42968.1-2023 （中英文版） Integrated circuits - Electromagnetic immunity measurements - Part 1: General conditions and definitions |
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GB/T 20870.5-2023 （中英文版） Semiconductor devices Part 16-5: Microwave integrated circuits Oscillators |
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GB/T 20870.2-2023 （中英文版） Semiconductor devices Part 16-2: Microwave integrated circuits Prescalers |
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GB/T 20870.10-2023 （中英文版） Semiconductor Devices Part 16-10: Monolithic Microwave Integrated Circuit Technology Acceptable Procedures |
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GB/T 42848-2023 （中英文版） Semiconductor integrated circuits - Test methods for direct digital frequency synthesizers |
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