“Test method for sili ” 中國GB標準檢索結果 |
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1. 已翻譯的GB標準英文版（有 SALE
標誌的），以及GB標準中文版，可以直接在網站上購買，在收到您付款後，會在1～3天內發您郵箱。 2. 其他未翻譯的GB標準英文版，在接到您翻譯訂單後，才進行翻譯，時間一般需要多3～5天。 |
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GB/T 30868-2014 碳化硅单晶片微管密度的测定 化学腐蚀法（中英文版） Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching |
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GB/T 30867-2014 碳化硅单晶片厚度和总厚度变化测试方法（中英文版） Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers |
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GB/T 30866-2014 碳化硅单晶片直径测试方法（中英文版） Test method for measuring diameter of monocrystalline silicon carbide wafers |
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GB/T 30454-2013 LED用稀土硅酸盐荧光粉试验方法（中英文版） Test methods of silicate phosphors activated by rare earths for LED |
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GB/T 29852-2013 光伏电池用硅材料中P、As、Sb施主杂质含量的二次离子质谱测量方法（中英文版） Test method for measuring Phosphorus, Arsenic and Antimony in silicon materials used for photovoltaic applications by secondary ion mass spectrometry |
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GB/T 29851-2013 光伏电池用硅材料中B、Al受主杂质含量的二次离子质谱测量方法（中英文版） Test method for measuring Boron and Aulminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry |
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GB/T 29850-2013 光伏电池用硅材料补偿度测量方法（中英文版） Test method for measuring compensation degree of silicon materials used for photovoltaic applications |
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GB/T 29849-2013 光伏电池用硅材料表面金属杂质含量的电感耦合等离子体质谱测量方法（中英文版） Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry |
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GB/T 29507-2013 硅片平整度、厚度及总厚度变化测试 自动非接触扫描法（中英文版） Test method for measuring flatness, thickness and total thickness variation on silicon wafers by automated non-contact scanning |
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GB/T 29505-2013 硅片平坦表面的表面粗糙度测量方法（中英文版） Test method for measuring surface roughness on planar surfaces of silicon wafer |
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GB/T 26068-2010 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法（中英文版） Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance |
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GB/T 26067-2010 硅片切口尺寸测试方法（中英文版） Standard test method for dimensions of notches on silicon wafers |
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GB/T 6621-2009 硅片表面平整度测试方法（中英文版） Testing methods for surface flatness of silicon slices |
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GB/T 6620-2009 硅片翘曲度非接触式测试方法（中英文版） Test method for measuring warp on silicon slices by noncontact scanning |
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GB/T 6619-2009 硅片弯曲度测试方法（中英文版） Test methods for bow of silicon wafers |
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GB/T 6618-2009 硅片厚度和总厚度变化测试方法（中英文版） Test method for thickness and total thickness variation of silicon slices |
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GB/T 6617-2009 硅片电阻率测定 扩展电阻探针法（中英文版） Test method for measuring resistivity of silicon wafer using spreading resistance probe |
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GB/T 4058-2009 硅抛光片氧化诱生缺陷的检验方法（中英文版） Test method for detection of oxidation induced defects in polished silicon wafers |
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GB/T 24578-2009 硅片表面金属沾污的全反射X光荧光光谱测试方法（中英文版） Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy |
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GB/T 24577-2009 热解吸气相色谱法测定硅片表面的有机污染物（中英文版） Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography |
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GB/T 24575-2009 硅和外延片表面Na、Al、K和Fe的二次离子质谱检测方法（中英文版） Test method for measuring surface sodium,aluminum,potassium,and iron on silicon and epi substrates by secondary ion mass spectrometry |
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GB/T 24574-2009 硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法（中英文版） Test methods for photoluminescence analysis of single crystal silicon for III-V impurities |
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GB/T 24582-2009 酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质（中英文版） Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry |
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GB/T 24581-2009 低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法（中英文版） Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities |
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GB/T 24580-2009 重掺n型硅衬底中硼沾污的二次离子质谱检测方法（中英文版） Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry |
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GB/T 24579-2009 酸浸取 原子吸收光谱法测定多晶硅表面金属污染物（中英文版） Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy |
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GB/T 1554-2009 硅晶体完整性化学择优腐蚀检验方法（中英文版） Testing method for crystallographic perfection of silicon by preferential etch techniques |
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GB/T 1553-2009 硅和锗体内少数载流子寿命测定光电导衰减法（中英文版） Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay |
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GB/T 1551-2009 硅单晶电阻率测定方法（中英文版） Test method for measuring resistivity of monocrystal silicon |
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GB/T 14144-2009 硅晶体中间隙氧含量径向变化测量方法（中英文版） Testing method for determination of radial interstitial oxygen variation in silicon |
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GB/T 14141-2009 硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法（中英文版） Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array |
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GB/T 13387-2009 硅及其它电子材料晶片参考面长度测量方法（中英文版） Test method for measuring flat length wafers of silicon and other electronic materials |
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GB/T 1558-2009 硅中代位碳原子含量 红外吸收测量方法（中英文版） Test method for substitutional atomic carbon concent of silicon by infrared absorption |
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GB/T 1036-2008 塑料 -30℃～30℃线膨胀系数的测定 石英膨胀计法（中英文版） Test method for coefficient of linear thermal expansion of plastics between -30℃ and 30℃ with a vitreous silica dilatometer |
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GB/T 10701-2008 石英玻璃热稳定性试验方法（中英文版） Test methods for thermal stability of silica glass |
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GB/T 16175-2008 医用有机硅材料生物学评价试验方法（中英文版） Biological evaluation test methods for medical organic silicon materials |
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GB/T 19922-2005 硅片局部平整度非接触式标准测试方法（中英文版） Standard test methods for measuring site flatness on silicon wafers by noncontact scanning |
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GB/T 14142-1993 硅外延层晶体完整性检查方法 腐蚀法（中英文版） Test method for crystallographic perfection of epit-axial layers in silicon by etching techniques |
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GB/T 12442-1990 石英玻璃中羟基含量检验方法（中英文版） Test method for the hydroxyl groups contentof silica glass |
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