“Measuring method in ” 中國GB標準檢索結果 |
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SJ 20646-1997 混合積體電路dc/dc變換器測試方法(中英文版) The measuring methods of DC/DC converters for hybrid integrated circuits |
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SJ 20645-1997 微波電路放大器測試方法(中英文版) Microwave circuits Measuring methods for amplifiers |
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SJ/T 10741-2000 半導體積體電路 cmos電路測試方法的基本原理(中英文版) Semiconductor integrated circuits General principles of measuring methods for CMOS circuits |
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SJ 20672-1998 電磁遮罩襯墊遮罩品質的測量方法(中英文版) Measuring methods for shielding quality of electromagnetic shielding gaskets |
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SJ 20858-2002 碳化矽單晶材料電學參數測試方法(中英文版) Measuring methods for electrical parameters of silicon carbide single crystal material |
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SJ 20785-2000 超輻射發光二極體元件測試方法(中英文版) Measuring methods for super luminescent diode module |
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SJ/T 11082-2000 電子管熱絲或燈絲電流和電壓的測試方法(中英文版) Measuring methods of the heater of filament current and voltage for electronic tubes |
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SJ/T 10805-2000 半導體積體電路電壓比較器測試方法的基本原理(中英文版) Semiconductor interface integrated circuits General principles of measuring methods for voltage comparators |
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SJ/T 10804-2000 半導體積體電路電平轉換器測試方法的基本原理(中英文版) Semiconductor integrated circuits. General principles of measuring methods for level translator |
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SJ 20803-2001 微波電路 壓控振盪器測試方法(中英文版) Microwave circuits Measuring methods for voltage controlled oscillator |
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SJ 20869-2003 鈮酸鋰集成光學波導調製器測試方法(中英文版) Measuring methods for LiNbO3 integrated optical guided-wave modulators |
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SJ 20868-2003 電荷藕合成像器件測試方法(中英文版) Measuring methods for charge coupled imaging device |
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SJ 20939-2005 微波光纖傳輸系統收發模組光電參數測試方法(中英文版) Microwave optical fiber transmitted system and transmitter receiver model measuring methods for opto-electronic parameter |
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SJ 20938-2005 微波電路變頻測試方法(中英文版) Microwave circuits. Measuring methods for frequency converters |
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SJ 20966-2006 軟磁鐵氧體材料測量方法(中英文版) Measuring methods for soft ferrite materials |
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SJ 20961-2006 積體電路a/d和d/a轉換器測試方法的基本原理(中英文版) General principles of measuring methods of A/D and D/A converters for integrated circuits |
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SJ/T 11405-2009 光纖系統用半導體光電子器件 第2部分:測量方法(中英文版) Semiconductor optoelectronic devices for fibre optic system applications. Part 2: Measuring methods |
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SJ/T 2658.9-2015 半導體紅外發射二極體測量方法 第9部分:輻射強度空間分佈和半強度角(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle |
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SJ/T 2658.8-2015 半導體紅外發射二極體測量方法 第8部分:輻射強度(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 8: Radiant intensity |
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SJ/T 2658.7-2015 半導體紅外發射二極體測量方法 第7部分:輻射通量(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 7: Radiant flux |
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SJ/T 2658.6-2015 半導體紅外發射二極體測量方法 第6部分:輻射功率(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 6: Radiant power |
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SJ/T 2658.5-2015 半導體紅外發射二極體測量方法 第5部分:串聯電阻(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 5: Series connection resistance |
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SJ/T 2658.4-2015 半導體紅外發射二極體測量方法 第4部分:總電容(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 4: Total capacitance |
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SJ/T 2658.3-2015 半導體紅外發射二極體測量方法 第3部分:反向電壓和反向電流(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 3: Reverse voltage and reverse current |
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SJ/T 2658.2-2015 半導體紅外發射二極體測量方法 第2部分:正向電壓(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 2: Forward voltage |
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SJ/T 2658.13-2015 半導體紅外發射二極體測量方法 第13部分:輻射功率溫度係數(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 13: Temperature coefficient for radiant power |
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SJ/T 2658.12-2015 半導體紅外發射二極體測量方法 第12部分:峰值發射波長和光譜輻射頻寬(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 12: Peak-emission wavelength and spectral radiant bandwidth |
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SJ/T 2658.1-2015 半導體紅外發射二極體測量方法 第1部分:總則(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 1: General |
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SJ/T 2658.11-2015 半導體紅外發射二極體測量方法 第11部分:回應時間(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 11: Response time |
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SJ/T 2658.10-2015 半導體紅外發射二極體測量方法 第10部分:調製頻寬(中英文版) Measuring method for semiconductor infrared-emitting diode - Part 10: Modulation bandwidth |
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