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JJF 1105-2003 觸針式表面粗糙度測量儀校準規範(中英文版) Calibration specification for contact (stylus) instruments of surface roughness measurement by the profile method |
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JJF 1102-2003 內徑表校準規範(中英文版) Calibration specification for bore dial indicators |
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JJF 1101-2003 環境試驗設備溫度、濕度校準規範(中英文版) Calibration specification for the equipment of the environmental testing for temperature and humidity |
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JJF 1100-2003 平面等厚干涉儀校準規範(中英文版) Calibration Specification for Flat Equal Thickness Interferometers |
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JJF 1098-2003 熱電偶、熱電阻自動測量系統校準規範(中英文版) Calibration Specification for Auto-measuring System of Thermocouples and Resistance Thermom |
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JJF 1097-2003 平尺校準規範(中英文版) Calibration Specification for Straight Edges |
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JJF 1096-2002 引伸計標定器校準規範(中英文版) Calibration Specification for Calibrator of Extensome |
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JJF 1095-2002 電容器介質損耗測量儀校準規範(中英文版) Calibration Specification for Capacitor Dielectric Loss Meters |
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JJF 1093-2002 投影儀校準規範(中英文版) Calibration Specification for Projectors |
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JJF 1092-2002 光切顯微鏡校準規範(中英文版) Calibration Specification for Light. Section Microscopes |
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JJF 1091-2002 測量內尺寸千分尺校準規範(中英文版) Calibration Specification for Micrometers for Measuring Inside Dimension |
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JJF 1090-2002 非金屬建材塑限測定儀校準規範(中英文版) Calibration Specification for Nonmetal Building Materials Plastic Limit Measuring Instrum |
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JJF 1089-2002 滾動軸承徑向遊隙測量儀校準規程(中英文版) Calibration Specification for Instruments for Measuring Radial Clearance of Rolling Bearing |
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JJF 1088-2002 外徑千分尺(測量範圍500mm~3000mm)校準規範(中英文版) Calibration Specification for Micrometers with Measuring Range from 500mm to 3000mm |
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JJF 1084-2002 框式水平儀和條式水平儀校準規範(中英文版) Calibration Specification for Frame Levels and Shaft Levels |
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JJF 1083-2002 光學傾斜儀校準規範(中英文版) Calibration Specification for Optical Clinometers |
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JJF 1081-2002 垂准儀校準規範(中英文版) Calibration Specification for Plumb Instruments |
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JJG(SJ)31001-2006 (中英文版) Specification for verification of testing system for integrated circuit electrostatic discharge susceptibility |
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JJG(SJ)310006-2006 (中英文版) Specification for verification of noise detectors for particle collision of devices |
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JJG(SJ)310005-2006 (中英文版) Specification for verification of high temperature dynamic aging system of integrated circuit |
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JJG(SJ)310004-2006 (中英文版) Specification for verification of transistor h parameter testers |
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JJG(SJ)310003-2006 (中英文版) Specification for verification of capacitor parameter testers for semiconductor discrete devices |
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JJG(SJ)310002-2006 (中英文版) Specification for verification of DC parameter testers for semiconductor discrete devices |
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JJG(SJ)30902-2006 (中英文版) Specification for verification of absolute spectral response rate of photodetectors |
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JJG(SJ)306003-2006 (中英文版) Specification for verification of leakage current testers |
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JJG(SJ)306002-2006 (中英文版) Specification for verification of standard samples of radio frequency electric medium |
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JJG(SJ)306001-2006 (中英文版) Specification for verification of standardizer of radio frequency coaxial impedance |
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JJG 31001-2006 (中英文版) Specification for verification of testing system for integrated circuit electrostatic discharge susceptibility |
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JJG 310006-2006 (中英文版) Specification for verification of noise detectors for particle collision of devices |
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JJG 310005-2006 (中英文版) Specification for verification of high temperature dynamic aging system of integrated circuit |
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