“GB ” 中國GB標準檢索結果 |
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1. 已翻譯的GB標準英文版(有 SALE
標誌的),以及GB標準中文版,可以直接在網站上購買,在收到您付款後,會在1~3天內發您郵箱。 2. 其他未翻譯的GB標準英文版,在接到您翻譯訂單後,才進行翻譯,時間一般需要多3~5天。 |
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GB/T 5729-2003 (中英文版) Fixed resistors for use in electronic equipment--Part 1:Generic specification |
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GB/T 4182-2003 (中英文版) Molybdenum wire |
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GB/T 2423.52-2003 (中英文版) Environmental testing for electric and electronic products--Part 2:Test methods--Test 77:Body strength and impact shock |
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GB/T 19405.2-2003 (中英文版) Surface mounting technology--Part 2:Transportation and storage conditions of surface mounting devices(SMD)--Application guide |
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GB/T 19405.1-2003 (中英文版) Surface mounting technology--Part 1:Standard method for the specification of surface mounting components(SMDs) |
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GB/T 19404-2003 (中英文版) Microwave ferrite components--Measuringmethods for major properties |
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GB/T 19403.1-2003 (中英文版) Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits) |
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GB/T 19247.4-2003 (中英文版) Printed board assemblies--Part 4:Sectional specification--Requirements for terminal soldered assemblies |
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GB/T 19247.3-2003 (中英文版) Printed board assemblies--Part 3:Sectional specification--Requirements for through-hole mount soldered assemblies |
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GB/T 18910.2-2003 (中英文版) Liquid crystal and solid-state display devices--Part 2:Liquid crystal display modules sectional specification |
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GB/T 18794.7-2003 (中英文版) Information technology--Open Systems Interconnection--Security frameworks for open systems--Part 7:Security audit and alarms framework |
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GB/T 18794.6-2003 (中英文版) Information technology--Open Systems Interconnection--Security frameworks for open systems--Part 6:Integrity framework |
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GB/T 18794.5-2003 (中英文版) Information technology--Open Systems Interconnection--Security frameworks for open systems--Part 5:Confidentiality framework |
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GB/T 18794.4-2003 (中英文版) Information technology--Open Systems Interconnection--Security frameworks for open systems--Part 4:Non-repudiation framework |
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GB/T 18794.3-2003 (中英文版) Information technology--Open Systems Interconnection--Security frameworks for open systems--Part 3:Access control framework |
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GB/T 18714.3-2003 (中英文版) Information technology--Open distributed processing--Reference model--Part 3:Architecture |
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GB/T 18311.5-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 3-5:Examinations and measurements--Wavelength dependence of attenuation |
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GB/T 18311.4-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 3-4:Examinations and measurements--Attenuation |
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GB/T 18311.40-2003 (中英文版) Fibre optic interconnecting devices and passivecomponents--Basic test and measurement procedures--Part 3-40:Examinations and measurements--Extinction ratio of a polarization maintaining(pm)fibre pigtailed connector |
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GB/T 18311.34-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 3-34:Examinations and measurements--Attenuation of random mated connectors |
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GB/T 18311.1-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 3-1:Examinations and measurements--Visual examination |
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GB/T 18310.9-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-9:Tests--Shock |
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GB/T 18310.45-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-45:Tests--Durability test by water immersion |
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GB/T 18310.42-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-42:Tests--Static side load for connectors |
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GB/T 18310.26-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-26:Tests--Salt mist |
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GB/T 18310.22-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test andmeasurement procedures--Part 2-22:Tests--Change of temperature |
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GB/T 18310.17-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-17:Tests--Cold |
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GB/T 18310.14-2003 (中英文版) Fibre optic interconnecting devices and passive components--Basic test and measurement procedures--Part 2-14:Tests--Maximum input power |
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GB/T 17574.10-2003 (中英文版) Semiconductor devices--Integrated circuits--Part 2-10:Digital integrated circuits--Blank detail specification for integrated circuit dynamicread/write memories |
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GB/T 16681-2003 (中英文版) Information technology--Chinese interface specifications of open system |
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