“Test method for sili ” 中國GB標準檢索結果 |
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1. 已翻譯的GB標準英文版（有 SALE
標誌的），以及GB標準中文版，可以直接在網站上購買，在收到您付款後，會在1～3天內發您郵箱。 2. 其他未翻譯的GB標準英文版，在接到您翻譯訂單後，才進行翻譯，時間一般需要多3～5天。 |
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GB/T 32281-2015 太陽能級矽片和矽料中氧、碳、硼和磷量的測定 二次離子質譜法（中英文版） Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry |
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GB/T 32280-2015 矽片翹曲度測試 自動非接觸掃描法（中英文版） Test method for warp of silicon wafers—Automated non-contact scanning method |
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GB/T 32278-2015 碳化矽單晶片平整度測試方法（中英文版） Test methods for flatness of monocrystalline silicon carbide wafers |
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GB/T 32277-2015 矽的儀器中子活化分析測試方法（中英文版） Test method for instrumental neutron activation analysis (INAA) of silicon |
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GB/T 31854-2015 光伏電池用矽材料中金屬雜質含量的電感耦合等離子體質譜測量方法（中英文版） Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry |
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GB/T 31851-2015 矽酮結構密封膠中烷烴增塑劑檢測方法（中英文版） Test method for alkane plasticizer in structural silicone sealants |
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GB/T 31351-2014 碳化矽單晶拋光片微管密度無損檢測方法（中英文版） Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers |
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GB/T 31225-2014 橢圓偏振儀測量矽表面上二氧化矽薄層厚度的方法（中英文版） Test method for the thickness of silicon oxide on Si substrate by ellipsometer |
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GB/T 30869-2014 太陽能電池用矽片厚度及總厚度變化測試方法（中英文版） Test method for thickness and total thickness variation of silicon wafers for solar cell |
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GB/T 30868-2014 碳化矽單晶片微管密度的測定 化學腐蝕法（中英文版） Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching |
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GB/T 30867-2014 碳化矽單晶片厚度和總厚度變化測試方法（中英文版） Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers |
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GB/T 30866-2014 碳化矽單晶片直徑測試方法（中英文版） Test method for measuring diameter of monocrystalline silicon carbide wafers |
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GB/T 30860-2014 太陽能電池用矽片表面粗糙度及切割線痕測試方法（中英文版） Test methods for surface roughness and saw mark of silicon wafers for solar cells |
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GB/T 30859-2014 太陽能電池用矽片翹曲度和波紋度測試方法（中英文版） Test method for warp and waviness of silicon wafers for solar cells |
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GB/T 30454-2013 LED用稀土矽酸鹽螢光粉試驗方法（中英文版） Test methods of silicate phosphors activated by rare earths for LED |
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GB/T 29852-2013 光伏電池用矽材料中P、As、Sb施主雜質含量的二次離子質譜測量方法（中英文版） Test method for measuring Phosphorus, Arsenic and Antimony in silicon materials used for photovoltaic applications by secondary ion mass spectrometry |
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GB/T 29851-2013 光伏電池用矽材料中B、Al受主雜質含量的二次離子質譜測量方法（中英文版） Test method for measuring Boron and Aulminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry |
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GB/T 29850-2013 光伏電池用矽材料補償度測量方法（中英文版） Test method for measuring compensation degree of silicon materials used for photovoltaic applications |
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GB/T 29849-2013 光伏電池用矽材料表面金屬雜質含量的電感耦合等離子體質譜測量方法（中英文版） Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry |
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GB/T 29507-2013 矽片平整度、厚度及總厚度變化測試 自動非接觸掃描法（中英文版） Test method for measuring flatness, thickness and total thickness variation on silicon wafers by automated non-contact scanning |
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GB/T 29505-2013 矽片平坦表面的表面粗糙度測量方法（中英文版） Test method for measuring surface roughness on planar surfaces of silicon wafer |
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GB/T 26068-2010 矽片載流子複合壽命的無接觸微波反射光電導衰減測試方法（中英文版） Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance |
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GB/T 26067-2010 矽片切口尺寸測試方法（中英文版） Standard test method for dimensions of notches on silicon wafers |
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GB/T 24582-2009 酸浸取 電感耦合等離子質譜儀測定多晶矽表面金屬雜質（中英文版） Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry |
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GB/T 24581-2009 低溫傅立葉轉換紅外光譜法測量矽單晶中III、V族雜質含量的測試方法（中英文版） Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities |
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GB/T 24580-2009 重摻n型矽襯底中硼沾汙的二次離子質譜檢測方法（中英文版） Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry |
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GB/T 24579-2009 酸浸取 原子吸收光譜法測定多晶矽表面金屬污染物（中英文版） Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy |
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GB/T 24578-2015 矽片表面金屬沾汙的全反射X光螢光光譜測試方法（中英文版） Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy |
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GB/T 24578-2009 矽片表面金屬沾汙的全反射X光螢光光譜測試方法（中英文版） Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy |
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GB/T 24577-2009 熱解吸氣相色譜法測定矽片表面的有機污染物（中英文版） Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography |
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