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“Measuring method in ” 中國GB標準檢索結果

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GB/T 20292-2019
(中英文版)
Methods for measuring the performance of tumble dryers for household use
GB/T 5702-2019
(中英文版)
Method of measuring the color rendering properties of light sources
GB/T 6113.106-2018
(中英文版)
Specification for radio disturbance and immunity measuring apparatus and methods—Part 1-6: Radio disturbance and immunity measuring apparatus—EMC antenna calibration
GB/T 37158-2018
(中英文版)
Non-destructive testing—Test method for measuring the maximum detectable steel thickness by industrial computed tomography(CT)
GB/T 36979-2018
(中英文版)
Measuring method of spatial distribution of color characteristics for LED products
GB/T 6113.201-2018
(中英文版)
Specification for radio disturbance and immunity measuring apparatus and methods-Part 2-1:Methods of measurement of disturbances and immunity-Conducted disturbance measurements
GB/T 6113.105-2018
(中英文版)
Specification for radio disturbance and immunity measuring apparatus and methods—Part 1-5:Radio disturbance and immunity measuring apparatus—Antenna calibration sites and reference test sites for 5 MHz to 18 GHz
GB/T 21203-2018
(中英文版)
Information technology-Office equipment-Method for measuring digital copying productivity
GB/T 36474-2018
(中英文版)
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
GB/T 36477-2018
(中英文版)
Semiconductor integrated circuit—Measuring methods for flash memory
GB/T 6113.202-2018
(中英文版)
Specification for radio disturbance and immunity measuring apparatus and methods—Part 2-2: Methods of measurement of disturbances and immunity—Measurement of disturbance power
GB/T 6113.102-2018
(中英文版)
Specification for radio disturbance and immunity measuring apparatus and methods—Part 1-2:Radio disturbance and immunity measuring apparatus—Coupling devices for conducted disturbance measurements
GB/T 35839-2018
(中英文版)
Non-destructive testing—Test method for measuring industrial computed tomography (CT) density
GB/T 36005-2018
(中英文版)
Measuring methods of optical radiation safety for semiconductor lighting equipments and systems
GB/T 35007-2018
(中英文版)
Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
GB/T 35006-2018
(中英文版)
Semiconductor integrated circuits—Measuring method of level converter
GB/T 35002-2018
(中英文版)
Microwave circuits—Measuring methods for frequency source
GB/T 35011-2018
(中英文版)
Microwave circuits—Measuring methods for voltage controlled oscillater
GB/T 14028-2018
(中英文版)
Semiconductor integrated circuits—Measuring method of analogue switch
GB/Z 6113.401-2018
(中英文版)
Specification for radio disturbance and immunity measuring apparatus and methods—Part 4-1:Uncertainties,statistics and limit modelling—Uncertainties in standardized EMC tests
GB/T 6113.402-2018
(中英文版)
Specification for radio disturbance and immunity measuring apparatus and methods—Part 4-2:Uncertainties, statistics and limit modelling—Measurement instrumentation uncertainty
GB/T 4377-2018
(中英文版)
Semiconductor integrated circuits—Measuring method of voltage regulators
GB/T 34894-2017
(中英文版)
Micro-electromechanical system technology—Measuring method for strain gradient measurements of MEMS microstructures using an optical interferometer
GB/T 34900-2017
(中英文版)
Micro-electromechanical system technology—Measuring method for residual strain measurements of MEMS microstructures using an optical interferometer
GB/T 34893-2017
(中英文版)
Micro-electromechanical system technology—Measuring method for in-plane length measurements of MEMS microstructures using an optical interferometer
GB/T 34899-2017
(中英文版)
Micro-electromechanical system technology—Measuring method of microstructure surface stress based on Raman spectroscopy
GB/T 18800-2017
(中英文版)
Household microwave oven—Methods for measuring performance
GB/T 34481-2017
(中英文版)
Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices
GB/T 34454-2017
(中英文版)
Dry cleaning robots for household use—Methods of measuring performance
GB/T 7676.9-2017
(中英文版)
Direct acting indicating analogue electrical measuring instruments and their accessories—Part 9:Recommended test methods

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