“The method for the d ” 中國GB標準檢索結果 |
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1. 已翻譯的GB標準英文版（有 SALE
標誌的），以及GB標準中文版，可以直接在網站上購買，在收到您付款後，會在1～3天內發您郵箱。 2. 其他未翻譯的GB標準英文版，在接到您翻譯訂單後，才進行翻譯，時間一般需要多3～5天。 |
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SJ/T 11036-1996 電子玻璃平均線熱膨脹係數的測試方法（中英文版） Test method for average linear thermal expansion of electronic glass |
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SJ/T 11033-1996 電子玻璃密度的測試方法 浮沉法（中英文版） Test method for density of electronic glass by the sink -- float comparator |
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SJ/T 10985-1996 陰極射線管靜電偏轉極的命名方法（中英文版） Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes |
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SJ/T 10930-1996 電子工業用矽酸鉀溶液中氯化物的測定方法（中英文版） Potassium silicate solution for use in electronic industry -- The methods of determination for chloride |
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SJ/T 10929-1996 電子工業用矽酸鉀溶液中重金屬（ｐｂ）的測定方法（中英文版） Potassium silicate solution for use in electronic industry. The methods of determination for weighty metals |
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SJ/T 10928-1996 電子工業用矽酸鉀溶液中鎳的測定方法（中英文版） Potassium silicate solution for use in electronic industry. The methods of determination for nickel |
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SJ/T 10927-1996 電子工業用矽酸鉀溶液中銅的測定方法（中英文版） Potassium silicate solution for use in electronic industry. The methods of determination for copper |
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SJ/T 10926-1996 電子工業用矽酸鉀溶液中鐵的測定方法（中英文版） Potassium silicate solution for use in electronic industry. The methods of determination for iron |
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SJ/T 10925-1996 電子工業用矽酸鉀溶液濃度及模數的計算方法（中英文版） Potassium silicate solution for use in electronic industry. The methods of calculation for concentration and modulus |
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SJ/T 10924-1996 電子工業用矽酸鉀溶液中二氧化矽含量的測定方法（中英文版） Potassium silicate solution for use in electronic industry. The methods of determination for silica content |
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SJ/T 10923-1996 電子工業用矽酸鉀溶液中總鹼度的測定方法（中英文版） Potassium silicate solution for use in electronic industry. The methods of determination for total alkalinity |
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SJ/T 10871-1996 盤封管電性能測試方法 三音互調失真的測試方法（中英文版） Methods of measurement for electrical properties of disk-seal tubes - Methods of measurement for the three tone inter-modulation distortion |
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SJ/T 10755-1996 電子器件用金、銀及其合金釺焊料檢驗方法 濺散性檢驗方法（中英文版） Test method for gold, silver and their alloy brazing for electron device. Test method for spatter |
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SJ/T 10754-1996 電子器件用金、銀及其合金釺焊料檢驗方法 清潔性檢驗方法（中英文版） Test method for gold, silver and their alloy brazing for electron device. Test method for cleanness |
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SJ 20646-1997 混合積體電路dc/dc變換器測試方法（中英文版） The measuring methods of DC/DC converters for hybrid integrated circuits |
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SJ 20713-1998 砷化鎵用高鈍鎵中銅、錳、鎂、釩、鈦等12種雜質的等離子體光譜分析法（中英文版） Method for the determination of 12 species of impurities including copper, manganese, magnesium, vanadium, titanium in high-purity gallium used for gallium arsenide by ICP spectrometry |
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SJ 20667-1998 艦載火控雷達戰術性能試驗方法（中英文版） The testing methods of tactical performance for Ship borne fire-control radars |
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SJ/T 11211-1999 石英晶體元件參數的測量 第5部分：採用自動網路分析技術和誤差校正確定等效電參數的方法（中英文版） Measurement of quartz crystal unit parameters. Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
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SJ/T 11210-1999 石英晶體元件參數的測量 第4部分：頻率達30mhz石英晶體元件負載諧振頻率fl和負載諧振電阻rl的測量方法及其他匯出參數的計算（中英文版） Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz |
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SJ 20746-1999 液晶材料性能測試方法（中英文版） Test method for the properties of liquid crystal materials |
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SJ 20789-2000 mos場效應電晶體熱敏參數快速篩選試驗方法（中英文版） Rapid screening test methods for Thermal sensitive parameter of MOS field effect transistor |
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SJ 20788-2000 半導體二極體熱阻抗測試方法（中英文版） Measurment method for thermal impedance of semiconductor diodes |
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SJ 20787-2000 半導體橋式整流器熱阻測試方法（中英文版） Measurment method for thermal resistance of semiconductor bridge rectifieres |
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SJ 20779-2000 熱固性絕緣塑膠層壓板試驗方法（中英文版） Test methods for insulation plastics sheet laminated thermosetting |
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SJ/T 11082-2000 電子管熱絲或燈絲電流和電壓的測試方法（中英文版） Measuring methods of the heater of filament current and voltage for electronic tubes |
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SJ 20963-2006 鎢錸合金中錸含量的測定方法（中英文版） Method for determination the content of rhenium of tungsten-rhenium alloy |
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SJ/T 11522-2015 影院揚聲器系統主要性能測試方法（中英文版） (The main theater speaker system performance test methods) |
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SJ/T 31024-2016 數控車床完好要求和檢查評定方法（中英文版） (CNC lathes and inspection requirements for integrity evaluation method) |
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SJ/T 31001-2016 設備完好要求和檢查評定方法編寫導則（中英文版） (Equipment availability requirements and guidelines for the preparation method of assessment for) |
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SJ/T 11497-2015 砷化鎵晶片熱穩定性的試驗方法（中英文版） Test method for thermal stability testing of gallium arsenide wafers |
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