“Integrated circuit c ” 中國GB標準檢索結果 |
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1. 已翻譯的GB標準英文版（有 SALE
標誌的），以及GB標準中文版，可以直接在網站上購買，在收到您付款後，會在1～3天內發您郵箱。 2. 其他未翻譯的GB標準英文版，在接到您翻譯訂單後，才進行翻譯，時間一般需要多3～5天。 |
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GB/T 17801-1999 （中英文版） Interface betweendata terminal equipment(DTE) and data circuit-terminating equipment (DCE) for terminals operating in the packet mode and accessing a packet switched public data network through a public switched telephone network or an integrated service |
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GB/T 9424-1998 （中英文版） Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Five:Blank detail specification for complementary MOS digital inte-grated circuits，series 4000B and 4000UB |
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GB/T 17574-1998 （中英文版） Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits |
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GB/T 17573-1998 （中英文版） Semiconductor devices--Discrete devices and integrated circuits--Part 1:General |
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GB/T 17572-1998 （中英文版） Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Four:Family specification for complementary MOS digital integrated circuits，series 4000B and 4000UB |
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GB/T 4023-1997 （中英文版） Semiconductor devices--Discrete devices and integrated circuits--Part 2:Rectifier diodes |
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GB/T 17024-1997 （中英文版） Semiconductor devices--integratedcircuits--Part 2:Digital integrated circuits--Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HC，54/74HCT，54/74HCU |
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GB/T 17023-1997 （中英文版） Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section two--Family specification for HCMOS digital integrated circuits series 54/74HC，54/74HCT，54/74HCU |
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GB/T 16878-1997 （中英文版） Specification for metrology pattern cells for integrated circuit manufacture |
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GB/T 16791.1-1997 （中英文版） Financial transaction cards--Messages between the integrated circuit card and the card accepting device--Part 1:Concepts and structures |
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GB/T 16790.1-1997 （中英文版） Financial transaction cards--Security architecture of financial transaction systems using integrated circuit cards--Part 1:Card life cycle |
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GB/T 8976-1996 （中英文版） Generic specification for film integrated circuits and hybrid film integrated circuits |
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GB/T 6798-1996 （中英文版） Semiconductor integrated circuits--General principles of measuring methods of voltage comparators |
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GB/T 4377-1996 （中英文版） Semiconductor integrated circuits--General principles of measuring methods of voltage regulator |
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GB/T 3436-1996 （中英文版） Semiconductor integrated circuits--Series and products of operational amplifier |
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GB/T 16466-1996 （中英文版） Blank detailspecification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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GB/T 16465-1996 （中英文版） Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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GB/T 16464-1996 （中英文版） Semiconductor devices--Integrated circuits--Part 1:General |
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GB/T 15879-1995 （中英文版） Mechanical standardization of semiconductor devices--Part 5:Recommendations applying to tape automated bonding (TAB) of integrated circuits |
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GB/T 15651-1995 （中英文版） Semiconductor devices--Discrete devices and integrated circuits--Part 5:Optoelectronic devices |
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GB/T 4587-1994 （中英文版） Semiconductor discrete devices and integrated circuits--Part 7:Bipolar transistors |
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GB/T 4376-1994 （中英文版） Series and products of voltage regulators for semi-conductor integrated circuits |
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GB/T 15138-1994 （中英文版） Case outlines for film integrated circuits and hybrid integrated circuits |
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GB/T 15136-1994 （中英文版） General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits |
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GB/T 14862-1993 （中英文版） Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits |
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GB/T 14129-1993 （中英文版） Series and productsfor TTL semiconductor integrated circuits--Products of series PAL |
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GB/T 7092-1993 （中英文版） Outline dimensions of semiconductor integratedcircuits |
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GB/T 14115-1993 （中英文版） General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits |
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GB/T 14114-1993 （中英文版） General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits |
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GB/T 14032-1992 （中英文版） General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits |
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