“Crystal unit, quartz” 中國GB標準檢索結果 |
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GB/T 22319.9-2018 石英晶體元件參數的測量 第9部分:石英晶體元件寄生諧振的測量(中英文版) Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units |
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GB/T 22319.11-2018 石英晶體元件參數的測量 第11部分:採用自動網路分析技術和誤差校正確定負載諧振頻率和有效負載電容的標準方法(中英文版) Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
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GB/T 12273.1-2017 有品質評定的石英晶體元件 第1部分:總規範(中英文版) Quartz crystal units of assessed quality—Part 1:Generic specification |
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SJ/Z 9158-1987 石英晶體件用溫度控制裝置(中英文版) Temperature control unit for quartz crystal elements |
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SJ/Z 9154.2-1987 用π型網路零相位法測量石英晶體件參數 第二部分:測量石英晶體件動態電容的相位偏置法(中英文版) Measurement of quartz crystal unit parameters by zero phase technique in a π-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
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SJ/Z 9154.1-1987 用π型網路零相位法測量石英晶體件參數 第一部分:測量石英晶體件諧振頻率和諧振電阻的基本方法(中英文版) Measurement of quartz crystal unit parameters by zero phase technique in a π-network. Part 1: Basic method for the measurement of resonance resistance and frequency of quartz crys |
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SJ/Z 9152.3-1987 頻率控制和選擇用石英晶體件 第三部分:標準外形及插腳連接(中英文版) Quartz Crystal units for frequency control and selection. Part 3: Standard outlines and pin connections |
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SJ/Z 9152.2-1987 頻率控制和選擇用石英晶體件 第二部分:頻率控制和選擇用石英晶體件使用指南(中英文版) Quartz Crystal units for frequency control and selection. Part 2: Guide to the use of quartz Crystal units for frequency control and selection |
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SJ/T 10015-1991 ju38和ju26型鐘錶用32khz音叉石英晶體件(中英文版) 32kHz tuning fork quartz crystal units for clocks and watches type JU38 and JU26 |
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SJ/T 9570.1-1995 石英晶體件品質分等標準(中英文版) Quality grading standard for quartz crystal units |
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SJ/T 10639-1995 石英晶體件術語(中英文版) Quartz crystal unit terms |
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SJ 52138.1-1995 ja538型石英晶體元件詳細規範(中英文版) Crystal unit, quartz, type JA 538. Detail specification |
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SJ/T 10707-1996 石英晶體件-電子器件品質評定體系規範 第2部分:分規範-能力批准 第一篇 空白詳細規範(中英文版) Quartz crystal units. A specification in the Quality Assessment System for Electronic Components. Part 2: Sectional specification. Capability approval. Section 1:Blank detail specification |
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SJ/T 10708-1996 石英晶體件-電子器件品質評定體系規範 第3部分:分規範-鑒定批准 第一篇 空白詳細規範(中英文版) Quartz crystal units. A specification in the Quality Assessment System for Electronic Components. Part 3: Sectional specification. Qualification approval. Section 1:Blank detail specification |
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SJ/T 11212-1999 石英晶體元件參數的測量 第6部分:激勵電平相關性(dld)的測量(中英文版) Measurement of quartz crystal unit parameters. Part 6: Measurement of drive level dependence (DLD) |
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SJ/T 11211-1999 石英晶體元件參數的測量 第5部分:採用自動網路分析技術和誤差校正確定等效電參數的方法(中英文版) Measurement of quartz crystal unit parameters. Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
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SJ/T 11210-1999 石英晶體元件參數的測量 第4部分:頻率達30mhz石英晶體元件負載諧振頻率fl和負載諧振電阻rl的測量方法及其他匯出參數的計算(中英文版) Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz |
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SJ/T 10015-2013 10kHz~200kHz音叉石英晶體元件的測試方法和標準值(中英文版) Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
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GB/T 6429-1986 石英諧振器型號命名方法(中英文版) The rule of type designation for quartz crystalunits |
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GB/T 22319.8-2008 石英晶體元件參數的測量 第8部分:表面貼裝石英晶體元件用測量夾具(中英文版) Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units |
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GB/T 22319.7-2015 石英晶體元件參數的測量 第7部分:石英晶體元件活性跳變的測量(中英文版) Measurement of quartz crystal unit parameters—Part 7: Measurement of activity dips of quartz crystal units |
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GB/T 16517-1996 石英晶體元件 電子元器件品質評定體系規範 第3部分:分規範 鑒定批准(中英文版) Quartz crystal units--A specification in the quality assessment system for electronic components--Part 3:Sectional specification--Qualification approval |
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GB/T 16516-1996 石英晶體元件 電子元器件品質評定體系規範 第2部分:分規範 能力批准(中英文版) Quartz crystal units--A specification in the quality assessment system for electronic components--Part 2:Sectional specification--Capability approval |
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GB/T 12273-1996 石英晶體元件 電子元器件品質評定體系規範 第1部分:總規範(中英文版) Quartz crystal units--A specification in the quality assessment system for electronic components--Part 1:Generic specification |
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GB/T 12273.501-2012 石英晶體元件 電子元器件品質評定體系規範 第5.1部分:空白詳細規範 鑒定批准(中英文版) Quartz crystal units A specification in the quality assessment system for electronic components Part 5.1: Blank detail specification- qualification approval |
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