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GB/T 28893-2024 Surface Chemical Analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-methods for determining peak intensity and information required for reporting results 表面化学分析-俄歇电子能谱和X射线光电子能谱-测定峰强度的方法和报告结果所需的信息 - 中英文版 |
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GB/T 28892-2024 Surface Chemical Analysis-X-ray photoelectron spectroscopy-selected instrument performance parameter statements 表面化学分析-X射线光电子能谱-选择仪器性能参数的表述 - 中英文版 |
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GB/T 43663-2024 Surface Chemical Analysis - Secondary ion mass spectrometry - Repeatability and consistency of relative intensity standards of static secondary ion mass spectrometry 表面化学分析-二次离子质谱-静态二次离子质谱相对强度标的重复性和一致性 - 中英文版 |
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GB/T 43661-2024 Surface Chemical Analysis - Scanning probe microscopy - Definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPM, such as SSRM and SCM) for two-dimensional imaging of dopants, etc. 表面化学分析-扫描探针显微术-用于二维掺杂物成像等用途的电扫描探针显微镜（ESPM，如SSRM和SCM）空间分辨的定义和校准 - 中英文版 |
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GB/T 19502-2023 Surface Chemical Analysis—General principles for glow discharge emission spectroscopy methods 表面化学分析 辉光放电发射光谱方法通则 - 中英文版 |
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GB/T 6609.35-2023 Methods for chemical analysis and determination of physical properties of alumina Part 35: Determination of specific surface area Nitrogen adsorption method 氧化铝化学分析方法和物理性能测定方法 第35部分：比表面积的测定 氮吸附法 - 中英文版 |
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GB/T 42659-2023 Surface Chemical Analysis Scanning probe microscopy Determination of geometric quantities using scanning probe microscopy: Calibration of measurement systems 表面化学分析 扫描探针显微术 采用扫描探针显微镜测定几何量：测量系统校准 - 中英文版 |
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GB/T 42658.4-2023 Surface Chemical Analysis Sample Handling, Preparation and Setup Guide Part 4: Reporting information on the origin, preparation, handling and set-up of nanoobjects prior to surface analysis 表面化学分析 样品处理、制备和安装指南 第4部分: 报告表面分析前纳米物体相关的来历、制备、处理和安装信息 - 中英文版 |
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GB/T 22461.1-2023 Surface Chemical Analysis Glossary Part 1: General and spectroscopic terminology 表面化学分析 词汇 第1部分：通用术语及谱学术语 - 中英文版 |
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GB/T 42543-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of the Normal Elastic Constant of a Cantilever Beam 表面化学分析 扫描探针显微术 悬臂梁法向弹性常数的测定 - 中英文版 |
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GB/T 22461.2-2023 Surface Chemical Analysis - Vocabulary Part 2: Scanning probe microscopy terminology 表面化学分析 词汇 第2部分： 扫描探针显微术术语 - 中英文版 |
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GB/T 42360-2023 Surface Chemical Analysis Total Reflection X-ray Fluorescence Spectroscopy of Water 表面化学分析 水的全反射X射线荧光光谱分析 - 中英文版 |
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GB/T 40129-2021 Surface Chemical Analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer 表面化学分析 二次离子质谱 飞行时间二次离子质谱仪质量标校准 - 中英文版 |
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GB/T 40128-2021 Surface Chemical Analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets 表面化学分析 原子力显微术 二硫化钼片层材料厚度测量方法 - 中英文版 |
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GB/T 40110-2021 Surface Chemical Analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析 全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染 - 中英文版 |
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GB/T 40109-2021 Surface Chemical Analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon 表面化学分析 二次离子质谱 硅中硼深度剖析方法 - 中英文版 |
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GB/T 41073-2021 Surface Chemical Analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy 表面化学分析 电子能谱 X射线光电子能谱峰拟合报告的基本要求 - 中英文版 |
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GB/T 29732-2021 Surface Chemical Analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis 表面化学分析 中等分辨俄歇电子能谱仪 元素分析用能量标校准 - 中英文版 |
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GB/T 41064-2021 Surface Chemical Analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films 表面化学分析 深度剖析 用单层和多层薄膜测定X射线光电子能谱、俄歇电子能谱和二次离子质谱中深度剖析溅射速率的方法 - 中英文版 |
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GB/T 41072-2021 Surface Chemical Analysis -- Electron spectroscopies -- Guidelines for ultraviolet photoelectron spectroscopy analysis 表面化学分析 电子能谱 紫外光电子能谱分析指南 - 中英文版 |
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GB/T 39527-2020 Determination of calcium, aluminium and silicon in the solid surface materials—Method of chemical analysis 实体面材产品中钙、铝、硅元素含量的测定 化学分析法 - 中英文版 |
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GB/T 36052-2018 Surface Chemical Analysis—Data transfer format for scanning probe microscopy 表面化学分析 扫描探针显微镜数据传送格式 - 中英文版 |
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GB/T 36401-2018 Surface Chemical Analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis 表面化学分析 X射线光电子能谱 薄膜分析结果的报告 - 中英文版 |
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GB/T 34326-2017 Surface Chemical Analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS 表面化学分析 深度剖析 AES和XPS深度剖析时离子束对准方法及其束流或束流密度测量方法 - 中英文版 |
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GB/T 34174-2017 Surface Chemical Analysis—Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation 表面化学分析 工作参考物质中离子注入产生的驻留面剂量定值的推荐程序 - 中英文版 |
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GB/T 22571-2017 Surface Chemical Analysis—X-ray photoelectron spectrometers—Calibration of energy scales 表面化学分析 X射线光电子能谱仪 能量标尺的校准 - 中英文版 |
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GB/T 33502-2017 Surface Chemical Analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS） 表面化学分析 X射线光电子能谱（XPS）数据记录与报告的规范要求 - 中英文版 |
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GB/T 33498-2017 Surface Chemical Analysis—Characterization of nanostructured materials 表面化学分析 纳米结构材料表征 - 中英文版 |
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GB/T 32998-2016 Surface Chemical Analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction 表面化学分析 俄歇电子能谱 荷电控制与校正方法报告的规范要求 - 中英文版 |
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GB/T 32997-2016 Surface Chemical Analysis—General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry 表面化学分析 辉光放电发射光谱定量成分深度剖析的通用规程 - 中英文版 |
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GB/T 32999-2016 Surface Chemical Analysis—Depth profiling—Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer 表面化学分析 深度剖析 用机械轮廓仪栅网复型法测量溅射速率 - 中英文版 |
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GB/T 32996-2016 Surface Chemical Analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry 表面化学分析 辉光放电发射光谱法分析金属氧化物膜 - 中英文版 |
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GB/Z 32494-2016 Surface Chemical Analysis—Auger electron spectroscopy—Derivation of chemical information 表面化学分析 俄歇电子能谱 化学信息的解析 - 中英文版 |
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GB/Z 32490-2016 Surface Chemical Analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds 表面化学分析 X射线光电子能谱 确定本底的程序 - 中英文版 |
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GB/T 32565-2016 Surface Chemical Analysis—Recording and reporting data in Auger electron spectroscopy (AES) 表面化学分析 俄歇电子能谱（AES）数据记录与报告的规范要求 - 中英文版 |
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GB/T 32495-2016 Surface Chemical Analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon 表面化学分析 二次离子质谱 硅中砷的深度剖析方法 - 中英文版 |
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GB/T 30815-2014 Surface Chemical Analysis―Guidelines for preparation and mounting of specimens for analysis 表面化学分析 分析样品的制备和安装方法指南 - 中英文版 |
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GB/T 30704-2014 Surface Chemical Analysis―X-ray photoelectron spectroscopy―Guidelines for analysis 表面化学分析 X射线光电子能谱 分析指南 - 中英文版 |
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GB/T 30702-2014 Surface Chemical Analysis―Auger electron spectroscopy and X-ray photoelectron spectroscopy―Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials 表面化学分析 俄歇电子能谱和X射线光电子能谱 实验测定的相对灵敏度因子在均匀材料定量分析中的使用指南 - 中英文版 |
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GB/T 30701-2014 Surface Chemical Analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy 表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定 - 中英文版 |
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GB/T 29732-2013 Surface Chemical Analysis - Medium resolution auger electron spectrometers - Calibration of energy scales for elemental analysis 表面化学分析 中等分辨率俄歇电子谱仪 元素分析用能量标校准 - 中英文版 |
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GB/T 29731-2013 Surface Chemical Analysis - High resolution auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis 表面化学分析 高分辨俄歇电子能谱仪 元素和化学态分析用能量标校准 - 中英文版 |
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GB/T 29559-2013 Surface Chemical Analysis - Analysis of zinc and/or aluminium based metallic coatings by glow discharge optical emission spectrometry 表面化学分析 辉光放电原子发射光谱 锌和/或铝基合金镀层的分析 - 中英文版 |
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GB/T 29558-2013 Surface Chemical Analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale 表面化学分析 俄歇电子能谱 强度标的重复性和一致性 - 中英文版 |
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GB/T 29557-2013 Surface Chemical Analysis - Depth profiling - Measurment of sputtered depth 表面化学分析 深度剖析 溅射深度测量 - 中英文版 |
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GB/T 29556-2013 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - determination of lateral resolution, analysis area, and sample area viewed by the analyser 表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率、分析面积和分析器所能检测到的样品面积的测定 - 中英文版 |
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GB/T 28894-2012 Surface Chemical Analysis - Handling of specimens prior to analysis 表面化学分析 分析前样品的处理 - 中英文版 |
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GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results 表面化学分析 俄歇电子能谱和X射线光电子能谱 测定峰强度的方法和报告结果所需的信息 - 中英文版 |
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GB/T 28892-2012 Surface Chemical Analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters 表面化学分析 X射线光电子能谱 选择仪器性能参数的表述 - 中英文版 |
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GB/T 28633-2012 Surface Chemical Analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale 表面化学分析 X射线光电子能谱 强度标的重复性和一致性 - 中英文版 |
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