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GB/T 32280-2022
Test method for warp and bow of silicon wafers—Automated non-contact scanning method
硅片翘曲度和弯曲度的测试  自动非接触扫描法 - 中英文版
GB/T 32280-2015
Test method for warp of silicon wafers—Automated non-contact scanning method
硅片翘曲度测试 自动非接触扫描法 - 中英文版
GB/T 31334.2-2015
Test methods for dipped canvas—Part 2: Yarn crimp on warp and density
浸胶帆布试验方法 第2部分:经向卷曲度和密度 - 中英文版
GB/T 31352-2014
Test methods for warp of sapphire substrates
蓝宝石衬底片翘曲度测试方法 - 中英文版
GB/T 30859-2014
Test method for warp and waviness of silicon wafers for solar cells
太阳能电池用硅片翘曲度和波纹度测试方法 - 中英文版
GB/T 7689.2-2013
Reinforcements - Test method for woven fabrics - Part 2: Determination of number of yarns per unit length of warp and weft
增强材料 机织物试验方法 第2部分:经、纬密度的测定 - 中英文版
GB/T 6620-2009
Test method for measuring warp on silicon slices by noncontact scanning
硅片翘曲度非接触式测试方法 - 中英文版

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