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GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers - Capacitance-voltage method - 英文版 |
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GB/T 3142-2019 Standard test method for determination of load-carrying capacity of lubricants—Four-ball method - 英文版 |
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GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method - 英文版 |
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GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method - 英文版 |
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GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance - 英文版 |
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GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay - 英文版 |
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GB/T 19936.1-2005 Gears-FZG test procedures-Part1:FZG test method A/8.3/90 for relative scuffing load-carrying capacity of oils - 英文版 |
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GB/T 5095.3-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 3:Current-carrying capacity tests - 英文版 |
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