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GB/T 18910.63-2024 Liquid crystal display devices - Part 6-3: Test methods for liquid crystal display modules - Active matrix liquid crystal display =Motion artifacts of display modules 液晶显示器件-第6-3部分：液晶显示模块测试方法-有源矩阵液晶显示模块运动伪像 - 英文版 |
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GB/T 43726-2024 Test methods for single liquid crystals 无刷直流力矩电动机通用技术条件 - 英文版 |
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GB/T 24581-2022 Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method 硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法 - 英文版 |
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GB/T 41765-2022 Test method for dislocation density of silicon carbide single crystal 碳化硅单晶位错密度的测试方法 - 英文版 |
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GB/T 41751-2022 Test method for radius of curvature of crystal surface of gallium nitride single crystal substrate 氮化镓单晶衬底片晶面曲率半径测试方法 - 英文版 |
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GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method 硅单晶电阻率的测定 直排四探针法和直流两探针法 - 英文版 |
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GB/T 9966.17-2021 Test methods for natural stone-Part 17:Determination of resistance to salt crystallization 天然石材试验方法 第17部分：盐结晶强度的测定 - 英文版 |
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GB/T 8760-2020 Test method for dislocation density of monocrystal gallium arsenide 砷化镓单晶位错密度的测试方法 - 英文版 |
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GB/T 5252-2020 Test method for dislocation density of monocrystal germanium 锗单晶位错密度的测试方法 - 英文版 |
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GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation 晶体材料X射线衍射仪旋转定向测试方法 - 英文版 |
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GB/T 37240-2018 Test and evaluation methods for light transmission property of cover glass for crystalline silicon photovoltaic module 晶体硅光伏组件盖板玻璃透光性能测试评价方法 - 英文版 |
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GB/T 4059-2018 Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere 硅多晶气氛区熔基磷检验方法 - 英文版 |
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GB/T 36655-2018 Test method for alpha crystalline silicon dioxide content of spherical silica powder for electronic packaging—XRD method 电子封装用球形二氧化硅微粉中α态晶体二氧化硅含量的测试方法 XRD法 - 英文版 |
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GB/T 4060-2018 Test method for boron content in polycrystalline silicon by vacuum zone-melting method 硅多晶真空区熔基硼检验方法 - 英文版 |
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GB/T 34481-2017 Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices 低位错密度锗单晶片腐蚀坑密度(EPD)的测量方法 - 英文版 |
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GB/T 14142-2017 Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique 硅外延层晶体完整性检验方法 腐蚀法 - 英文版 |
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GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal 蓝宝石单晶晶向测定方法 - 英文版 |
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GB/T 33763-2017 Test method for dislocation density of sapphire single crystal 蓝宝石单晶位错密度测量方法 - 英文版 |
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GB/T 35118-2017 Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal 掺铒钇铝石榴石激光晶体光学性能测量方法 - 英文版 |
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GB/T 35306-2017 Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry 硅单晶中碳、氧含量的测定 低温傅立叶变换红外光谱法 - 英文版 |
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GB/T 32278-2015 Test methods for flatness of monocrystalline silicon carbide wafers 碳化硅单晶片平整度测试方法 - 英文版 |
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GB/T 32282-2015 Test method for disoclation density of GaN single crystal—Cathodoluminescence spectroscopy 氮化镓单晶位错密度的测量 阴极荧光显微镜法 - 英文版 |
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GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope 氮化镓单晶衬底表面粗糙度的原子力显微镜检验法 - 英文版 |
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GB/T 19199-2015 Test method for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy 半绝缘砷化镓单晶中碳浓度的红外吸收测试方法 - 英文版 |
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GB/T 17170-2015 Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy 半绝缘砷化镓单晶深施主EL2浓度红外吸收测试方法 - 英文版 |
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GB/T 31568-2015 Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation 热喷涂热障ZrO2涂层晶粒尺寸的测定 谢乐公式法 - 英文版 |
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GB/T 31351-2014 Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers 碳化硅单晶抛光片微管密度无损检测方法 - 英文版 |
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GB/T 30653-2014 Test method for crystal quality of III-nitride epitaxial layers Ⅲ族氮化物外延片结晶质量测试方法 - 英文版 |
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GB/T 31093-2014 Test method for stress of monocrystalline sapphire ingot 蓝宝石晶锭应力测试方法 - 英文版 |
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GB/T 30868-2014 Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching 碳化硅单晶片微管密度的测定 化学腐蚀法 - 英文版 |
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GB/T 30867-2014 Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers 碳化硅单晶片厚度和总厚度变化测试方法 - 英文版 |
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GB/T 30866-2014 Test method for measuring diameter of monocrystalline silicon carbide wafers 碳化硅单晶片直径测试方法 - 英文版 |
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GB/T 11297.12-2012 Test method for extinction ratio of optical crystal 光学晶体消光比的测量方法 - 英文版 |
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GB/T 25275-2010 Polarizing film for Liquid Crystal Display (LCD) - Method of test for the properties of photics and weather resistance 液晶显示器（LCD）用偏振片 光学性能和耐候性能测试方法 - 英文版 |
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GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for III-V impurities 硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法 - 英文版 |
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GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry 酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质 - 英文版 |
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GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities 低温傅立叶变换红外光谱法测量硅单晶中III、V族杂质含量的测试方法 - 英文版 |
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GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy 酸浸取 原子吸收光谱法测定多晶硅表面金属污染物 - 英文版 |
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GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal 半导体单晶晶向测定方法 - 英文版 |
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GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques 硅晶体完整性化学择优腐蚀检验方法 - 英文版 |
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GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon 硅单晶电阻率测定方法 - 英文版 |
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GB/T 13255.2-2009 Test methods of caprolactam for industrial use - Part 2: Determination of crystallizing point 工业用己内酰胺试验方法 第2部分：结晶点的测定 - 英文版 |
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GB/T 7896-2008 Test method for optical grade synthetic quartz crystal 人造光学石英晶体试验方法 - 英文版 |
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GB/T 19199-2003 Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 半绝缘砷化镓单晶中碳浓度的红外吸收测试方法 - 英文版 |
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GB/T 17170-1997 Test method for deep level EL2 concentration of undoped semiinsulating monocrystal gallium arsenide by measurement infra-red absorption method 非掺杂半绝缘砷化镓单晶深能级EL2浓度红外吸收测试方法 - 英文版 |
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GB/T 16864-1997 Method for testing cryogenic transmissivityof crystals 低温下晶体透射率的试验方法 - 英文版 |
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GB/T 16863-1997 Method for testing refractive index of crystals 晶体折射率的试验方法 - 英文版 |
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GB/T 16822-1997 Test method for dielectric properties of dielectric crystal 介电晶体介电性能的试验方法 - 英文版 |
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GB/T 14142-1993 Test method for crystallographic perfection of epit-axial layers in silicon by etching techniques 硅外延层晶体完整性检查方法 腐蚀法 - 英文版 |
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GB/T 12634-1990 Test methods for electroelastic constants of piezoelectric crystals 压电晶体电弹常数测试方法 - 英文版 |
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