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GB/T 34831-2017 Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method 纳米技术 贵金属纳米颗粒电子显微镜成像 高角环形暗场法 - 英文版 |
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GB/T 33657-2017 Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells 纳米技术 晶圆级纳米尺度相变存储单元电学操作参数测试规范 - 英文版 |
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