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GB/T 42271-2022 Non-contact measurement method for resistivity of semi-insulating silicon carbide single crystal 半绝缘碳化硅单晶的电阻率非接触测试方法 - 英文版 |
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GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method 硅片和硅锭载流子复合寿命的测试-非接触微波反射光电导衰减法 - 英文版 |
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GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法 - 英文版 |
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