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GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method 硅片翘曲度和弯曲度的测试 自动非接触扫描法 - 英文版 |
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GB/T 32280-2015 Test method for warp of silicon wafers—Automated non-contact scanning method 硅片翘曲度测试 自动非接触扫描法 - 英文版 |
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GB/T 31334.2-2015 Test methods for dipped canvas—Part 2: Yarn crimp on warp and density 浸胶帆布试验方法 第2部分:经向卷曲度和密度 - 英文版 |
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GB/T 31352-2014 Test methods for warp of sapphire substrates 蓝宝石衬底片翘曲度测试方法 - 英文版 |
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GB/T 30859-2014 Test method for warp and waviness of silicon wafers for solar cells 太阳能电池用硅片翘曲度和波纹度测试方法 - 英文版 |
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GB/T 7689.2-2013 Reinforcements - Test method for woven fabrics - Part 2: Determination of number of yarns per unit length of warp and weft 增强材料 机织物试验方法 第2部分:经、纬密度的测定 - 英文版 |
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GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning 硅片翘曲度非接触式测试方法 - 英文版 |
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