China Test method for crys GB Standards Search Result |
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GB/T 11297.12-2012 Test method for extinction ratio of optical crystal - 英文版 |
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GB/T 25275-2010 Polarizing film for Liquid Crystal Display (LCD) - Method of test for the properties of photics and weather resistance - 英文版 |
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GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for III-V impurities - 英文版 |
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GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry - 英文版 |
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GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities - 英文版 |
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GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy - 英文版 |
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GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal - 英文版 |
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GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques - 英文版 |
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GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon - 英文版 |
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GB/T 13255.2-2009 Test methods of caprolactam for industrial use - Part 2: Determination of crystallizing point - 英文版 |
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GB/T 7896-2008 Test method for optical grade synthetic quartz crystal - 英文版 |
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GB/T 19199-2003 Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method - 英文版 |
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GB/T 17170-1997 Test method for deep level EL2 concentration of undoped semiinsulating monocrystal gallium arsenide by measurement infra-red absorption method - 英文版 |
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GB/T 16864-1997 Method for testing cryogenic transmissivityof crystals - 英文版 |
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GB/T 16863-1997 Method for testing refractive index of crystals - 英文版 |
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GB/T 16822-1997 Test method for dielectric properties of dielectric crystal - 英文版 |
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GB/T 14142-1993 Test method for crystallographic perfection of epit-axial layers in silicon by etching techniques - 英文版 |
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GB/T 12634-1990 Test methods for electroelastic constants of piezoelectric crystals - 英文版 |
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GB/T 11312-1989 Test methods for SAW properties of piezoelectric ceramics and crystals - 英文版 |
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GB/T 11297.7-1989 Test method for resistivity and hall coefficient indium antimonide single crystals - 英文版 |
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