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GB/T 7962.16-2010 Test methods of colourless optical glass - Part 16: Linear thermal expansion coefficient,transformation temperature and yield point temperature - 英文版 |
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GB/T 7962.11-2010 Test method for colourless optical glass - Part 11: Precise test method for refractive index in the visible wave band - 英文版 |
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GB/T 26352-2010 Test methods of cockroach resistance to insecticides - The bioassay methods for Blattella germanica - 英文版 |
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GB/T 26350-2010 Test methods of fly resistance to insecticides - The bioassay methods for Musca domestica - 英文版 |
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GB/T 26348-2010 Test methods of mosquito resistance to insecticides - Test methods of insensitive acetylcholinesterase for the mosquito - 英文版 |
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GB/T 26107-2010 Metallic and other inorganic coatings - Test for residual embrittlement in both metallic-coated and uncoated externally-threaded articles and rods - Inclined wedge method - 英文版 |
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GB/T 25996-2010 Test method for thermal insulations on external stress corrosion cracking of austenitic stainless steel - 英文版 |
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GB/T 9169-2010 Standard Test method for thermal oxidation stability of aviation turbine fuels - JFTOT procedure - 英文版 |
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GB/T 25967-2010 Test methods for thermal performance of domestic solar-plus-supplementary water heating systems - 英文版 |
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GB/T 25962-2010 Standard test method for determining the leakage tendencies of automotive wheel bearing grease under accelerated conditions - 英文版 |
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GB/T 25749.3-2010 Safety of machinery - Evaluation of the emission of airborne hazardous substances - Part 3: Test bench method for the measurement of the emission rate of a given pollutant - 英文版 |
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GB/Z 6113.405-2010 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-5: Uncertainties, statistics and limit modelling - Conditions for the use of alternative test methods - 英文版 |
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GB/T 25496-2010 Test methods for the mechanical properties of getters - 英文版 |
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GB/T 25275-2010 Polarizing film for Liquid Crystal Display (LCD) - Method of test for the properties of photics and weather resistance - 英文版 |
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GB/T 16294-2010 Test method for settling microbe in clean room(zone) of the pharmaceutical industry - 英文版 |
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GB/T 16293-2010 Test method for airborne microbe in clean room(zone) of the pharmaceutical industry - 英文版 |
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GB/T 16292-2010 Test method for airborne particles in clean room(zone) of the pharmaceutical industry - 英文版 |
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GB 12476.9-2010 Electrical apparatus for use in the presence of combustible dust - Part 9: Test methods - Method for determining the electrical resistivity of dust in layers - 英文版 |
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GB 12476.8-2010 Electrical apparatus for use in the presence of combustible dust - Part 8: Test methods - Methods for determining the minimum ignition temperatures of dust - 英文版 |
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GB 12476.10-2010 Electrical apparatus for use in the presence of combustible dust - Part 10: Test methods - Method for determining minimum ignition energy of dust/air mixtures - 英文版 |
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GB/T 14634.3-2010 Test methods of rare earth three-band phosphors for fluorescent lamps - Part 3: Determination of thermostability - 英文版 |
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GB/T 24935-2010 The test method of maximum stable side-inclination for all-terrain vehicles - 英文版 |
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GB/T 24684.3-2009 Crop protection equipment - Test methods for the evaluation of cleaning systems - Part 3: Internal cleaning of tank - 英文版 |
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GB/T 24684.2-2009 Crop protection equipment - Test methods for the evaluation of cleaning systems - Part 2:External cleaning of sprayers - 英文版 |
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GB/T 24684.1-2009 Crop protection equipment - Test methods for the evaluation of cleaning systems - Part 1:Internal cleaning of complete sprayers - 英文版 |
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GB/T 14710-2009 The environmental requirement and test methods for medical electrical equipment - 英文版 |
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GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography - 英文版 |
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GB/T 24576-2009 Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction - 英文版 |
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GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal - 英文版 |
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GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials - 英文版 |
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