China Measuring method of GB Standards Search Result |
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GB/T 27903-2011 Fire resistance test for lift landing doors - Methods of measuring integrity,thernal insulation and heat flux - 英文版 |
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GB/T 28014-2011 Methods for measuring the performance of electric warming plates for household and similar purposes - 英文版 |
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GB/T 26490-2011 Methods for measuring super hydrophobicity of nanomaterials - 英文版 |
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GB/T 26489-2011 Methods for measuring super amphiphilicity of nanomaterials - 英文版 |
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GB/T 26282-2010 Measuring methods of heat balance of cement rotary kiln - 英文版 |
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GB/T 26277-2010 Test method for measuring electrical resistance of tyres - 英文版 |
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GB/T 26303.3-2010 Measuring methods for dimensions and shapes of wrought copper and copper alloys - Part 3: Sheets and strips - 英文版 |
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GB/T 26303.2-2010 Measuring methods for dimensions and shapes of wrought copper and copper alloy - Part 2: Rod，wire and profile - 英文版 |
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GB/T 26303.1-2010 Measuring method for dimensions and shapes of wrought copper and copper alloy - Part 1: Tube - 英文版 |
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GB/T 26180-2010 Method of measuring and specifying colour rendering of light sources - 英文版 |
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GB/Z 6113.405-2010 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-5: Uncertainties, statistics and limit modelling - Conditions for the use of alternative test methods - 英文版 |
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GB/T 25471-2010 Measuring methods for electromagnetic shielding effectiveness of coating - 英文版 |
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GB/T 16701-2010 Methods for measuring the thermoelectric force of noble metal and base matal thermocouple wires - 英文版 |
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GB/T 25374-2010 Metal-cutting machine tools - Measuring method of cleanliness - 英文版 |
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GB/T 25346-2010 Procedures and measuring methods for the transfer of bunker fuels to ships - 英文版 |
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GB/T 6624-2009 Standard method for measuring the surface quality of polished silicon slices by visual inspection - 英文版 |
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GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe - 英文版 |
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GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge - 英文版 |
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GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry - 英文版 |
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GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy - 英文版 |
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GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon - 英文版 |
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GB/T 14140-2009 Test method for measuring diameter of semiconductor wafer - 英文版 |
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GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques - 英文版 |
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GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials - 英文版 |
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GB/T 23285-2009 Micrographics - Aperture cards - Method of measuring thickness of buildup area - 英文版 |
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GB/T 23129-2008 Methods for measuring the performance of electric household coffee maker - 英文版 |
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GB/T 22628-2008 Test method of measuring rolling circumference for motorcycle tyres - 英文版 |
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GB/T 2523-2008 Measuring method of surface roughness and peak count for cold-rolled metal sheet (strip) - 英文版 |
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GB/T 16685-2008 Information technology - Office equipment - Printing devices Method for measuring throughput - Class 1 and Class 2 printers - 英文版 |
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GB/T 7922-2008 Method of measuring the color of light sources - 英文版 |
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