China Measuring methods fo GB Standards Search Result |
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1. Ready translated GB standards ![]() 2. Other English version GB Standards are not ready translated, only after get your order, then we translate them, time usually need 3-5 days . |
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GB/T 8554-1998 Transformers and inductors for use in electronic and telecommunication equipment--Measuring methodsand test procedures - 英文版 |
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GB/T 7397.3-1998 Measuring methods for non-broadcast video tape recorders--Part 3:Audio characteristics for FMrecording - 英文版 |
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GB/T 5095.9-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 9:Miscellaneous tests - 英文版 |
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GB/T 5095.8-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 8:Connector tests(mechanical)and mechanical tests on contacts and terminations - 英文版 |
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GB/T 5095.7-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 7:Mechanical operating tests and sealing tests - 英文版 |
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GB/T 5095.6-1997 Electromechanical components for electronic equipment--Basic testing proceduresand measuring methods--Part 6:Climatic tests and soldering tests - 英文版 |
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GB/T 5095.5-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 5:Impact tests(free components),static load tests(fixed components),endurance tests and overload tests - 英文版 |
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GB/T 5095.4-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 4:Dynamic stress tests - 英文版 |
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GB/T 5095.3-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 3:Current-carrying capacity tests - 英文版 |
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GB/T 5095.2-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 2:Generalexamination,electrical continuity and contact resistance tests,insulationtests and voltage stress tests - 英文版 |
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GB/T 5095.15-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 15:Mechanical tests on contacts and terminations--Section 8:Test 15h--Contact retention system resistance to tool application - 英文版 |
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GB/T 5095.12-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 12:Soldering tests--Section 6:Test 12f--Sealing against flux and cleaning solvents inmachine soldering - 英文版 |
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GB/T 5095.1-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuringmethods--Part 1:General - 英文版 |
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GB/T 5095.11-1997 Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 11:Climatic tests - 英文版 |
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GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials - 英文版 |
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GB/T 16760-1997 Preparation of standard methods of measuring performance (SMMP) of consumer goods - 英文版 |
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GB/T 15653-1995 Measuring methods for gas sensors of metal-oxide semiconductor - 英文版 |
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GB/T 7397-1995 Measuring methods for non-broadcast video tape recorders - 英文版 |
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GB/T 15293-1994 Measuring methods for thyristor--Gate turn-off thyristor - 英文版 |
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GB/T 15292-1994 Measuring methods for thyristor--Reverse conducting triode thyristor - 英文版 |
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GB/T 15136-1994 General principles of Measuring methods for quartz clock and watch circuits of semiconductor integrated circuits - 英文版 |
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GB/T 14854.1-1993 Measuring methods for broadcast video tape - 英文版 |
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GB/T 14432-1993 Measuring methods for wow and flutter of broadcast tape recorders - 英文版 |
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GB/T 14307-1993 Measuring methods for video tape properties - 英文版 |
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GB/T 14115-1993 General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits - 英文版 |
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GB/T 14114-1993 General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits - 英文版 |
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GB/T 14032-1992 General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits - 英文版 |
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GB/T 14031-1992 General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits - 英文版 |
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GB/T 14030-1992 General principles of measuring methods of timer circuits for semiconductor integrated circuits - 英文版 |
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GB/T 14029-1992 General principles of measuring methods of analogue multiplier for semiconductor integrated circuits - 英文版 |
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