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GB/T 21576-2008
Dangerous goods - Test method of gap for extremely insensitive detonate substance (EIDS)
- 英文版
GB/T 21575-2008
Dangerous goods - Test method of cap for extremely insensitive detonate substance(EIDS)
- 英文版
GB/T 21572-2008
Dangerous goods - Test method of external fire for division 1.5 article
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GB/T 21569-2008
Dangerous goods - Test method for top lift of large packaging
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GB/T 21568-2008
Dangerous goods - Test method for tensile break stress of packaging
- 英文版
GB/T 21567-2008
Dangerous goods - Test method for impact sensitivity of explosives substance
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GB/T 21566-2008
Dangerous goods - Test method for friction sensitivity of explosives substance
- 英文版
GB/T 18570.12-2008
Preparation of steel substrates before application of paints and related products-Tests for the assessment of surface cleanliness - Part 12: Field method for the titrimetric determination of water-soluble ferrous ions
- 英文版
GB/T 15972.52-2008
Specifications for optical fibre test methods - Part 52: Measurement methods and test procedures for environmental characteristics - Change of temperature
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GB/T 15972.46-2008
Specifications for optical fibre test methods - Part 46: Measurement methods and test procedures for transmission and optical characteristics - Monitoring of changes in optical transmittance
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GB/T 15972.44-2008
Specifications for optical fibre test methods - Part 44: Measurement methods and test procedures for transmission and optical characteristics - Cut-off wavelength
- 英文版
GB/T 19198-2008
Testing method for thermo-electromotive force of precious metals and their alloys pair up with platinum or copper
- 英文版
GB/T 17473.7-2008
Test methods of precious metals pastes used for microelectronics - Determination of solderability and solderelaching resistance
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GB/T 17473.6-2008
Test methods of precious metal pastes used for microelectronics - Determination of resolution
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GB/T 17473.5-2008
Test methods of pastes used for microelectronics - Determination of viscosity
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GB/T 17473.4-2008
Test methods of precious metals pastes used for microelectronics - Determination of adhesion
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GB/T 17473.3-2008
Test methods of precious metals pastes used for microelectronics Determination of sheet resistance
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GB/T 17473.2-2008
Test methods of presious metals pastes used for microelectronics - Determination of fineness
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GB/T 17473.1-2008
Test methods of precious metals pastes used for microelectronics-Determination of solids content
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GB/T 15078-2008
Testing method for contact resistance of precious metals electrical contact materials
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GB/T 15072.9-2008
Test method of precious metal alloys - Determination of indium content for gold alloys - Complexometric return titration using EDTA
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GB/T 15072.8-2008
Test method of precious metal alloys - Determination of copper content for gold, palladium and silver alloys - Complexometric return titration using thiourea releasing EDTA
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GB/T 15072.7-2008
Test methods of precious metal alloys - Determination of chromium and iron contents for gold alloys - Inductively coupled plasma atomic emission spectrometry
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GB/T 15072.6-2008
Test method of precious metal alloys - Determination of iridium contents for platinum, palladium alloys - Electricity titration with ferrous sulfate
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GB/T 15072.5-2008
Test method of precious metal alloys - Determination of silver content for gold and palladium alloys - Potentionmeter titration with potassium iodide
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GB/T 15072.4-2008
Test method of precious metal alloys - Determination of palladium content for palladium and silver alloys - Butanedione dioxime gravimetry
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GB/T 15072.3-2008
Test method of precious metal alloys - Determination of platinum content for gold, platinum and palladium alloys - Electricity titration using potassium permanganate
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GB/T 15072.2-2008
Test method of precious metal alloys - Determination of silver contents for silver alloys - Potentionmeter titration with sodium chloride
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GB/T 15072.19-2008
Test method of precious metal alloys - Determination of vanadium and magnesium contents for silver alloys - Inductively coupled plasma atomic emission spectrometry
- 英文版
GB/T 15072.18-2008
Test method of precious metal alloys - Determination of zirconium and gadolinium contents for gold alloys - Inductively coupled plasma atomic emission spectrometry
- 英文版

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