China Method for measuring GB Standards Search Result |
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GB/Z 6113.405-2010 Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-5: Uncertainties, statistics and limit modelling - Conditions for the use of alternative test methods - 英文版 |
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GB/T 25769-2010 Rolling bearings - Measuring methods for radial internal clearance - 英文版 |
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GB/T 25471-2010 Measuring methods for electromagnetic shielding effectiveness of coating - 英文版 |
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GB/T 16701-2010 Methods for measuring the thermoelectric force of noble metal and base matal thermocouple wires - 英文版 |
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GB/T 25346-2010 Procedures and measuring methods for the transfer of bunker fuels to ships - 英文版 |
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GB/T 24610.4-2009 Rolling bearings - Measuring methods for vibration - Part 4: Radial cylindrical roller bearings with cylindrical bore and outside surface - 英文版 |
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GB/T 24610.3-2009 Rolling bearings - Measuring methods for vibration - Part 3: Radial spherical and tapered roller bearings with cylindrical bore and outside surface - 英文版 |
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GB/T 24610.2-2009 Rolling bearings - Measuring methods for vibration - Part 2: Radial ball bearings with cylindrical bore and outside surface - 英文版 |
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GB/T 24610.1-2009 Rolling bearings - Measuring methods for vibration - Part 1: Fundamentals - 英文版 |
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GB/T 6624-2009 Standard Method for measuring the surface quality of polished silicon slices by visual inspection - 英文版 |
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GB/T 6620-2009 Test Method for measuring warp on silicon slices by noncontact scanning - 英文版 |
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GB/T 6617-2009 Test Method for measuring resistivity of silicon wafer using spreading resistance probe - 英文版 |
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GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge - 英文版 |
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GB/T 24578-2009 Test Method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy - 英文版 |
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GB/T 24576-2009 Test Method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction - 英文版 |
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GB/T 24575-2009 Test Method for measuring surface sodium,aluminum,potassium,and iron on silicon and epi substrates by secondary ion mass spectrometry - 英文版 |
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GB/T 24582-2009 Test Method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry - 英文版 |
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GB/T 24580-2009 Test Method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry - 英文版 |
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GB/T 24579-2009 Test Method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy - 英文版 |
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GB/T 1551-2009 Test Method for measuring resistivity of monocrystal silicon - 英文版 |
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GB/T 14140-2009 Test Method for measuring diameter of semiconductor wafer - 英文版 |
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GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques - 英文版 |
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GB/T 13387-2009 Test Method for measuring flat length wafers of silicon and other electronic materials - 英文版 |
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GB/T 23767-2009 General Method for measuring solid chemicals fire limits in gaseous oxidants - 英文版 |
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GB/T 23143-2008 Household stationary appliances for cooking, grilling and similar use - Methods for measuring performance - 英文版 |
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GB/T 23136-2008 Floor polishers for household and similar use - Methods for measuring the performance - 英文版 |
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GB/T 23129-2008 Methods for measuring the performance of electric household coffee maker - 英文版 |
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GB/T 23108-2008 Household and similar electrical heating pads - Methods for measuring performance - 英文版 |
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GB/T 23107-2008 Household and similar electrical blankets - Methods for measuring performance - 英文版 |
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GB/T 23106-2008 Household and similar electrical hair care appliances - Methods for measuring performance - 英文版 |
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