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GB/T 44078-2024
Determination of optical center spacing in optoelectronic systems - Low coherence interferometry
- 英文版
GB/T 20871.61-2024
Organic light-emitting diode display devices - Part 6-1: Test methods for optical and optoelectronic parameters
- 英文版
GB/T 43777-2024
Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
- 英文版
GB/T 43789.31-2024
Electronic paper display devices - Part 3-2: Test methods for optoelectronic properties
- 英文版
GB/T 15651.5-2024
Semiconductor devices - Part 5-5: Optoelectronic devices - Optocouplers
- 英文版
GB/T 43369-2023
Interface requirements for optoelectronic mission load equipment for large and medium-sized civilian UAVs
- 英文版
GB/T 43081-2023
Road vehicle bulbs and light sources - Dimensions, optoelectronic performance requirements
- 英文版
GB/T 42977-2023
Nanotechnology Nano-optoelectronic display Optical reliability determination of quantum dot light conversion films
- 英文版
GB/T 15651.6-2023
Semiconductor devices Part 5-6: Optoelectronic devices Light emitting diodes
- 英文版
GB/T 41310-2022
Image-based detection method for optoelectronic properties of vision modules
- 英文版
GB/T 4584-2022
Specification of active opto-electronic protective devices for presses
- 英文版
GB/T 41742-2022
Low temperature sealing glass for optoelectronic devices
- 英文版
GB/T 39585-2020
Opto-electronic measurement—Performance requirements and test methods of light distribution measurement system
- 英文版
GB/T 36229-2018
Reliability assessment method and index of active opto-electronic protective devices
- 英文版
GB/T 36360-2018
Semiconductor optoelectronic devices--Blank detail specification for middle power light-emitting diodes
- 英文版
GB/T 36358-2018
Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes
- 英文版
GB/T 36359-2018
Semiconductor optoelectronic devices—Blank detail specification for lower power light-emitting diodes
- 英文版
GB/T 33768-2017
Reliability test method for optoelectronic devices used in telecommunications
- 英文版
GB/T 15651.4-2017
Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers
- 英文版
GB/T 35437-2017
General specification for spaceborne opto-electronic tracking and imaging system
- 英文版
GB/T 19436.2-2013
Electrcial safety of machinery - Electro-sensitive protective equipment - Part 2: Particular requirements for equipment using active opto-electronic protective devices (AOPDs)
- 英文版
GB/T 29231-2012
Opto-electronic-opto transceiver of 650nm 100Mbps ethernet for plastic optical fiber transmission system
- 英文版
GB/T 29230.1-2012
Opto-electronic-opto bidirectional wavelength converter for plastic optical fiber transmission system - Part 1: Wavelength converter between 650nm and 1550nm (or 1310nm or 850nm) of 100Mbps ethernet
- 英文版
GB/T 24366-2009
Technical requirements of optoelectronic detector module for communication
- 英文版
GB/T 24365-2009
Testing methods of optoelectronic detector module for communication
- 英文版
GB 19436.3-2008
Electrical safety of machinery - Electro-sensitive protective equipment - Part 3: Particular requirements for Active Opto-electronic Protective Devices responsive to Diffuse Reflection(AOPDDR)
- 英文版
GB/T 21194-2007
Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment
- 英文版
GB 4584-2007
Specification of active opto-electronic protective devices for presses
- 英文版
GB/T 19894-2005
Digital still-picture cameras-Methods for measuring opto-electronic conversion functions(OECFs)
- 英文版
GB/T 15651.3-2003
Discrete semiconductor devices and integrated circuits--Part 5-3:Optoelectronic devices--Measuring methods
- 英文版

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