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GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method 硅单晶电阻率的测定 直排四探针法和直流两探针法 - 英文版 |
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GB/T 36613-2018 Probe test method for light emitting diode chips 发光二极管芯片点测方法 - 英文版 |
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GB/T 30823-2014 Nickel-alloy Probe test method for determination cooling characteristics of industrial quenching oil 测定工业淬火油冷却性能的镍合金探头试验方法 - 英文版 |
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GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe 硅片电阻率测定 扩展电阻探针法 - 英文版 |
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GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array 硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法 - 英文版 |
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