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GB/T 5686.9-2023 Ferromanganese, manganese-silicon alloy, ferromanganese nitride and metallic manganese. Determination of manganese, silicon, phosphorus and iron content. Wavelength dispersive X-ray fluorescence spectrometry (cast glass plate method) - 英文版 |
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GB/T 5686.5-2023 Ferromanganese, manganese-silicon alloy, ferromanganese nitride and metallic manganese Determination of carbon content Infrared absorption method, gas volume method, gravimetric method and coulometric method - 英文版 |
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GB/T 24582-2023 Determination of metal impurity content on polycrystalline silicon surface by acid leaching-inductively coupled plasma mass spectrometry - 英文版 |
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GB/T 5686.7-2022 Ferromanganese, manganese silicon alloy, ferromanganese nitride and metal manganese Determination of sulfur content Infrared absorption method and combustion neutralization titration method - 英文版 |
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GB/T 5686.1-2022 Ferromanganese, manganese silicon alloy, ferromanganese nitride and metal manganese Determination of manganese content Potentiometric titration, ammonium nitrate oxidation titration and perchloric acid oxidation titration - 英文版 |
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GB/T 5686.4-2022 Ferromanganese, manganese silicon alloy, ferromanganese nitride and metal manganese Determination of phosphorus content Molybdenum blue spectrophotometry and bismuth phosphorus molybdenum blue spectrophotometry - 英文版 |
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GB/T 5686.2-2022 Determination of ferromanganese, manganese-silicon alloy, ferromanganese nitride and metal manganese-silicon content Molybdenum blue spectrophotometry, potassium fluorosilicate titration and perchloric acid gravimetric method - 英文版 |
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GB/T 12690.7-2021 Chemical analysis methods for non-rare earth impurities of rare earth metals and their oxides—Part 7: Determination of silicon content - 英文版 |
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GB/T 39145-2020 Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry - 英文版 |
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GB/T 14849.3-2020 Methods for chemical analysis of Silicon metal--Part 3: Determination of calcium content - 英文版 |
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GB/T 14849.1-2020 Methods for chemical analysis of Silicon metal--Part 1: Determination of iron content - 英文版 |
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GB/T 37049-2018 Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method - 英文版 |
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GB/T 4702.6-2016 Chromium metal—Determination of iron, aluminium, silicon and copper content—Inductively coupled plasma atomic emission spectrometry method - 英文版 |
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GB/T 14849.11-2016 Methods for chemical analysis of Silicon metal—Part 11：Determination of chromium content—1,5-Diphenylcarbohydrazide spectrophotometric method - 英文版 |
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GB/T 14849.10-2016 Methods for chemical analysis of Silicon metal—Part 10：Determination of mercury content—Atomic fluorescence spectrometry method - 英文版 |
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GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy - 英文版 |
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GB/T 14849.8-2015 Methods for chemical analysis of Silicon metal—Part 8: Determination of copper content—Atomic absorption spectrometric method - 英文版 |
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GB/T 14849.9-2015 Methods for chemical analysis of Silicon metal—Part 9: Determination of titanium content —Diantipyryl methane spectrophotometry - 英文版 |
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GB/T 14849.7-2015 Methods for chemical analysis of Silicon metal—Part 7: Determination of phosphorus content—Phosphorus molybdenum blue spectrophotometry - 英文版 |
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GB/T 31854-2015 Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry - 英文版 |
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GB 31338-2014 The norm of energy consumption per unit products of Silicon metal - 英文版 |
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GB/T 2881-2014 Silicon metal - 英文版 |
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GB/T 14849.4-2014 Methods for chemical analysis of Silicon metal―Part 4：Determination of impurity contents―Inductively coupled plasma atomic emission spectrometric method - 英文版 |
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GB/T 14849.5-2014 Methods for chemical analysis of Silicon metal―Part 5：Determination of impurity contents―X-ray fluorescence method - 英文版 |
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GB/T 14849.6-2014 Methods for chemical analysis of Silicon metal―Part 6：Determination of carbon―Infrared absorption method - 英文版 |
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GB/T 30453-2013 Metallographs collection for original defects of crystalline silicon - 英文版 |
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GB/T 29849-2013 Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry - 英文版 |
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GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy - 英文版 |
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GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry - 英文版 |
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GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy - 英文版 |
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