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GB/T 41765-2022
Test method for dislocation density of silicon carbide single crystal
- 英文版
GB/T 8760-2020
Test method for dislocation density of monocrystal gallium arsenide
- 英文版
GB/T 5252-2020
Test method for dislocation density of monocrystal germanium
- 英文版
GB/T 34481-2017
Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices
- 英文版
GB/T 33763-2017
Test method for dislocation density of sapphire single crystal
- 英文版

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