China Test method for warp GB Standards Search Result |
 |
1. Ready translated GB standards  and Chinese version GB Standards, you can purchase directly in the web page; After receive your payment, we will send the GB Standards PDF file to your Email within
1~3 days.
2. Other English version GB Standards are not ready translated, only after get your order, then we translate them, time usually need 3-5 days . |
|
GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method - 英文版 |
 |
|
|
|
GB/T 32280-2015 Test method for warp of silicon wafers—Automated non-contact scanning method - 英文版 |
|
|
|
|
GB/T 31334.2-2015 Test methods for dipped canvas—Part 2: Yarn crimp on warp and density - 英文版 |
|
|
|
|
GB/T 31352-2014 Test methods for warp of sapphire substrates - 英文版 |
|
|
|
|
GB/T 30859-2014 Test method for warp and waviness of silicon wafers for solar cells - 英文版 |
|
|
|
|
GB/T 7689.2-2013 Reinforcements - Test method for woven fabrics - Part 2: Determination of number of yarns per unit length of warp and weft - 英文版 |
|
|
|
|
GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning - 英文版 |
|
| Find out:7Items | To Page of: First -Previous-Next -Last | 1 |
+86-755-2583-1330
