GB/T 26070-2010 Standard PDF file download ; GB/T 26070-2010 Standard english preview version download

GB Standard Code	GB/T 26070-2010
Standard Category	China National Standards
GB Standard English Title	Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method
GB Standard Chinese Title	化合物半导体抛光晶片亚表面损伤的反射差分谱测试方法
Chinese Version Price	$15 USD per 50 pages
English Translation Price	About $15 per 1 page; Inquire us for detail price

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