GB/T 14847-2010 Standard PDF file download ; GB/T 14847-2010 Standard english preview version download

GB Standard Code	GB/T 14847-2010
Standard Category	China National Standards
GB Standard English Title	Test mothod for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance
GB Standard Chinese Title	重掺杂衬底上轻掺杂硅外延层厚度的红外反射测量方法
Chinese Version Price	$15 USD per 50 pages
English Translation Price	About $15 per 1 page; Inquire us for detail price

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