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GB/T 2406.2-2009
Plastics - Determination of burning behaviour by oxygen index - Part 2: Ambient-temperature test
- 英文版
GB/T 11049-2008
Burning behaviour of carpets - Tablet test at Ambient temperature
- 英文版
GB/T 1685-2008
Rubber,vulcanized or thermoplastic - Determination of stress relaxation in compression at Ambient and at elevated temperatures
- 英文版
GB/T 14318-2008
Radiation protection instrumentation - Neutron Ambient dose equivalent(rate) meters
- 英文版
GB/T 3001-2007
Refractory products - Determination of modulus of rupture at Ambient temperature
- 英文版
GB/T 10128-2007
Metallic materials - Torsion test at Ambient temperature
- 英文版
GB/T 5564-2006
Rubber and plastics hoses - SubAmbient temperature flexibility tests
- 英文版
GB/T 20673-2006
Cellular plastics - Determination of the coefficient of linear thermal expansion of rigid materials at sub-Ambient temperatures
- 英文版
GB/T 7314-2005
Metallic materials-Compression testing at Ambient temperature
- 英文版
GB/T 13151-2005
Semiconductor devices Discrete devices Part 6:Thyristors Section Three-Blank detail specification for reverse blocking triode thyristors,Ambient and case-rated,for currents greater than 100A
- 英文版
GB/T 13150-2005
Semiconductor devices Discret devices Blank detail specification for bidirectional triode thyristors(triacs),Ambient and case-rated,for currents greater than 100A
- 英文版
GB/T 6590-1998
Semiconductor devices--Discrete devices--Part6:Thyristors--Section Two:Blank detail specification for bidirectional triode thyristors(triacs),Ambient or case-rated,up to 100A
- 英文版
GB/T 6352-1998
Semiconductor devices--Discrete devices--Part 6:Thyristors--Section One:Blank detail specification for reverse blocking triode thyristors,Ambient or case-rated,up to 100A
- 英文版
GB/T 6351-1998
Semiconductor devices--Discrete devices--Part 2:Rectifier diodes--Section One:Blank detail specification for rectifier diodes(including avalanche recti fier diodes),Ambient and case-rated,up to 100A
- 英文版
GB/T 6217-1998
Semiconductor devices--Discrete devices--Part 7:Bipolar transistors--Section One:Blank detail speci-fication for Ambient-rated bipolar transistors for low and high frequency amplification
- 英文版
GB/T 16894-1997
Blank detail specification for rectifier diodes (including avalanche rectifier diodes),Ambient and case-rated,for currents greater than 100A
- 英文版
GB/T 15439-1995
Air quality--Determination of benz[a]pyrene in Ambient air--High performance liquid chromatography
- 英文版
GB/T 15438-1995
Ambient air--Determination of ozone--Ultraviolet photometric method
- 英文版
GB/T 15437-1995
Ambient air--Determination of ozone--Indigo disulphonate spectrophotometry
- 英文版
GB/T 15436-1995
Ambient air--Determination of nitrogen oxides--Saltzman method
- 英文版
GB/T 15435-1995
Ambient air--Determination of nitrogen dioxide--Saltzman method
- 英文版
GB/T 15434-1995
Ambient air--Determination of the mass concentration of fluoride--Method by filter sampling andfluorine ion-selective electrode analysis
- 英文版
GB/T 15433-1995
Ambient air--Determination of the fluoride--Method by lime-paper sampling and fluorine ion-selective electrode analysis
- 英文版
GB/T 15432-1995
Ambient air--Determination of total suspended particulates--Gravimetric method
- 英文版
GB/T 15265-1994
Ambient air--Determination of dustfall--Gravimetric method
- 英文版
GB/T 15264-1994
Ambient air--Determination of lead--Flame atomic absorption spectrophotometric method
- 英文版
GB/T 15263-1994
Ambient air--Determination of total hydrocarbons--Gas chromatographic method
- 英文版
GB/T 15262-1994
Ambient air--Determination of sulfur dioxide--Formaldehyde absorbing-pararosaniline spectrophotometry
- 英文版
GB/T 13153-1991
Blank detail specification for gate turn-off thyristors,Ambient or case-rated,5A and above
- 英文版
GB/T 13152-1991
Blank detail specification for reverse conducting triode thyristors,Ambient or case-rated,5A/5A and above
- 英文版

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