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GB/T 26834-2011
Non-destructive testing instruments - Measurement of effective focal spot size of mini and micro focus X-ray tubes
- 英文版
GB/T 26833-2011
Non-destructive testing instruments - General specification for X-ray tube for industrial detecting
- 英文版
GB/T 26830-2011
Non-destructive testing instruments - High frequency constant potential X-ray equipment
- 英文版
GB/T 26595-2011
Non-destructive testing instruments - Specification for panoramic X-ray tube
- 英文版
GB/T 26594-2011
Non-destructive testing instruments - Properties test methods of industrial X-ray tube
- 英文版
GB/T 26593-2011
Non-destructive testing instruments - Properties test method for performance of industrial X-ray computed tomography(CT)equipment
- 英文版
GB/T 26592-2011
Non-destructive testing instruments - Properties test methods of industrial X-ray apparatus
- 英文版
GB/T 26276-2010
Test method of non-destructive inspection for earth-mover radial tyres - X-ray method
- 英文版
GB 16348-2010
Radiological protection standards for the examinee in medical X-ray diagnosis
- 英文版
GB/T 7962.10-2010
Test methods of colourless optical glass - Part 10:X-rays stability
- 英文版
GB/T 26050-2010
Hardmetals - Determination of contents of metallic elements by X-ray fluorescence - Fusion method
- 英文版
GB/T 25758.5-2010
Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes
- 英文版
GB/T 25758.4-2010
Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 4: Edge method
- 英文版
GB/T 25758.3-2010
Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 3: Slit camera radiographic method
- 英文版
GB/T 25758.2-2010
Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic method
- 英文版
GB/T 25758.1-2010
Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 1: Scanning method
- 英文版
GB/T 25188-2010
Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
- 英文版
GB/T 25185-2010
Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
- 英文版
GB/T 25184-2010
Verification method for X-ray photoelectron spectrometers
- 英文版
GB/T 50602-2010
Radiographic testing standard for a single exposure with γ-ray technique of spherical tank installation
- 英文版
GB/T 24684.2-2009
Crop protection equipment - Test methods for the evaluation of cleaning systems - Part 2:External cleaning of sprayers
- 英文版
GB/T 24578-2009
Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy
- 英文版
GB/T 24576-2009
Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction
- 英文版
GB/T 14141-2009
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
- 英文版
GB/T 13388-2009
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
- 英文版
GB/T 24519-2009
Manganese ores - Determination of magnesium, aluminum, silicon, phosphorus, sulfur, potassium, calcium, titanium, manganese, iron, nickel, copper, zinc, barium and lead content - Wavelength dispersive X-ray fluorescence spectrometric method
- 英文版
GB/T 24517-2009
Corrosion of metals and alloys - Outdoors exposure test methods for periodic water spray
- 英文版
GB/T 13797-2009
General specifications for medical X-ray tube
- 英文版
GB/T 24231-2009
Chrome ores - Determination of magnesium, aluminum, silicon, calcium, titanium, vanadium, chrome, manganese, iron and nickel content - Wavelength dispersive X-ray fluorescence spectrometric method
- 英文版
GB/T 24198-2009
Ferronickel - Determination of nickel, silicon, phosphorus, manganese, cobalt, chromium, and copper contents - Wavelength dispersive X-ray fluorescence spectrometry(Routine method)
- 英文版

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