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CNS Standards about "Semicond"

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2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days .
　 　 　  
CNS 5073 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Shock test)
單件半導體裝置之環境檢驗法及耐久性檢驗法－衝擊試驗 - 英文版
CNS 15187-4-1 - English Version
Low-voltage fuses - Part 4-1 : Supplementary requirements for fuses- links for the protection of Semiconductor devices - Sections I to III :
低壓熔線－第４－１部︰半導體裝置保護用熔線鏈之補充 - 英文版
CNS 3999 - English Version
General rules for mechanical standardization of Semiconductor integrated circuits
半導體積體電路尺度通則 - 英文版
CNS 4329 - English Version
The symbol of Semiconductor network
半導體網路符號 - 英文版
CNS 4331 - English Version
The symbol of Semiconductor rectifier
半導體整流體符號 - 英文版
CNS 5775 - English Version
Standard temperatures for electrical measurement and rating specification-Semiconductor devices
半導體裝置電性測量及額定規格之標準溫度 - 英文版
CNS 6137 - English Version
Color Coding of Discrete Semiconductor Devices
個別半導體元件之色碼 - 英文版
CNS 6560 - English Version
Measurement of Reverse Recovery Time for Semiconductor Diodes
高速二極體逆向回復時間之測量法 - 英文版
CNS 6806 - English Version
Type designation system for discrete Semiconductor devices
單件半導體裝置之型名 - 英文版
CNS 7011 - English Version
Numbering of Electrodes in Multiple Electrode Semiconductor Devices and Designation of Units in Multiple Unit Semiconductor
多極半導體裝置的電極編號與多元半導體裝置的元件命名 - 英文版
CNS 5066 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (General rules)
單件半導體裝置之環境檢驗法及耐久性檢驗法－總則 - 英文版
CNS 5067 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of soft solders for heat
單件半導體裝置之環境檢驗法及耐久性檢驗法－焊錫耐熱 - 英文版
CNS 5069 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of thermal shock)
單件半導體裝置之環境檢驗法及耐久性檢驗法－熱衝擊試 - 英文版
CNS 13802-5 - English Version
Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)
電機工程製圖符號（半導體及電子管） - 英文版
CNS 5071 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Cycle test for temperature &
單件半導體裝置之環境檢驗法及耐久性檢驗法－溫濕度循 - 英文版
CNS 11900 - English Version
Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)
電子設備用陶瓷固定電容器（半導體） - 英文版		 For Sale!
CNS 5074 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of free fall)
單件半導體裝置之環境檢驗法及耐久性檢驗法－自然落下 - 英文版
CNS 5075 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of constant acceleration)
單件半導體裝置之環境檢驗法及耐久性檢驗法－等加速度 - 英文版
CNS 5076 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Vibration test)
單件半導體裝置之環境檢驗法及耐久性檢驗法－振動試驗 - 英文版
CNS 5077 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of terminal strength)
單件半導體裝置之環境檢驗法及耐久性檢驗法－端子強度 - 英文版
CNS 5078 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of salt mist spray)
單件半導體裝置之環境檢驗法及耐久性檢驗法－鹽水噴霧 - 英文版
CNS 5539 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Continuous operation test of
單件半導體裝置之環境檢驗法及耐久性檢驗法－穩壓二極 - 英文版
CNS 5751 - English Version
Method of Test for Apparent Density of Ceramics for Electron Device and Semiconductor Application
電子元件與半導體應用之陶質視在密度測試法 - 英文版		 For Sale!
CNS 6117 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Damp heat test)
單件半導體裝置之環境檢驗法及耐久性檢驗法－耐濕性試 - 英文版
CNS 6118 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of storage under low
單件半導體裝置之環境檢驗法及耐久性檢驗法－低溫保存 - 英文版
CNS 6124 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Intermittent applying voltage test of
單件半導體裝置之環境檢驗法及耐久性檢驗法－閘流體之 - 英文版
CNS 6802 - English Version
Standard test procedure for noise margin measurements for Semiconductor logic gating microcircuits
半導體邏輯閘微電路雜訊界限之測試程序 - 英文版
CNS 13805 - English Version
Method of measurement for photoluminescence of optoelectronic Semiconductor wafers
光電半導體晶圓之光激光譜量測法 - 英文版
CNS 6127 - English Version
General Rules for Reliability Assured Discrete Semiconductor Devices
可靠度保證單件半導體裝置總則 - 英文版
CNS 5070 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Cycle test for temperature)
單件半導體裝置之環境檢驗法及耐久性檢驗法－溫度循環 - 英文版

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