Chinese National Standards -Taiwan
中華民國國家標準 -台灣
Home   CNS Standards Index   CNS Standards Search GB standards of P.R.China Contact Us
Keywords:  tube   Tank   bumper   distribution   Mechanical   quarantine   Aircraft   trucks   Takeoff   Asynchronous   Distilled   consumers   meat   Quantities   treatment   tableware   Glass   Bulb   disposal   measurement 
 

CNS Standards about "Semicond"

1. Ready translated english version CNS Standards ( SALE mark )  and Chinese version CNS Standards, you can purchase directly in the web page; After receive your payment, we will send the CNS Standards PDF file to your Email within 1~3 days.
2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days .
       
CNS 5073 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Shock test)
單件半導體裝置之環境檢驗法及耐久性檢驗法-衝擊試驗 - 英文版
CNS 15187-4-1 - English Version
Low-voltage fuses - Part 4-1 : Supplementary requirements for fuses- links for the protection of Semiconductor devices - Sections I to III :
低壓熔線-第4-1部︰半導體裝置保護用熔線鏈之補充 - 英文版
CNS 3999 - English Version
General rules for mechanical standardization of Semiconductor integrated circuits
半導體積體電路尺度通則 - 英文版
CNS 4329 - English Version
The symbol of Semiconductor network
半導體網路符號 - 英文版
CNS 4331 - English Version
The symbol of Semiconductor rectifier
半導體整流體符號 - 英文版
CNS 5775 - English Version
Standard temperatures for electrical measurement and rating specification-Semiconductor devices
半導體裝置電性測量及額定規格之標準溫度 - 英文版
CNS 6137 - English Version
Color Coding of Discrete Semiconductor Devices
個別半導體元件之色碼 - 英文版
CNS 6560 - English Version
Measurement of Reverse Recovery Time for Semiconductor Diodes
高速二極體逆向回復時間之測量法 - 英文版
CNS 6806 - English Version
Type designation system for discrete Semiconductor devices
單件半導體裝置之型名 - 英文版
CNS 7011 - English Version
Numbering of Electrodes in Multiple Electrode Semiconductor Devices and Designation of Units in Multiple Unit Semiconductor
多極半導體裝置的電極編號與多元半導體裝置的元件命名 - 英文版
CNS 5066 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (General rules)
單件半導體裝置之環境檢驗法及耐久性檢驗法-總則 - 英文版
CNS 5067 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of soft solders for heat
單件半導體裝置之環境檢驗法及耐久性檢驗法-焊錫耐熱 - 英文版
CNS 5069 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of thermal shock)
單件半導體裝置之環境檢驗法及耐久性檢驗法-熱衝擊試 - 英文版
CNS 13802-5 - English Version
Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)
電機工程製圖符號(半導體及電子管) - 英文版
CNS 5071 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Cycle test for temperature &
單件半導體裝置之環境檢驗法及耐久性檢驗法-溫濕度循 - 英文版
CNS 11900 - English Version
Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)
電子設備用陶瓷固定電容器(半導體) - 英文版
For Sale!
CNS 5074 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of free fall)
單件半導體裝置之環境檢驗法及耐久性檢驗法-自然落下 - 英文版
CNS 5075 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of constant acceleration)
單件半導體裝置之環境檢驗法及耐久性檢驗法-等加速度 - 英文版
CNS 5076 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Vibration test)
單件半導體裝置之環境檢驗法及耐久性檢驗法-振動試驗 - 英文版
CNS 5077 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of terminal strength)
單件半導體裝置之環境檢驗法及耐久性檢驗法-端子強度 - 英文版
CNS 5078 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of salt mist spray)
單件半導體裝置之環境檢驗法及耐久性檢驗法-鹽水噴霧 - 英文版
CNS 5539 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Continuous operation test of
單件半導體裝置之環境檢驗法及耐久性檢驗法-穩壓二極 - 英文版
CNS 5751 - English Version
Method of Test for Apparent Density of Ceramics for Electron Device and Semiconductor Application
電子元件與半導體應用之陶質視在密度測試法 - 英文版
For Sale!
CNS 6117 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Damp heat test)
單件半導體裝置之環境檢驗法及耐久性檢驗法-耐濕性試 - 英文版
CNS 6118 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Test of storage under low
單件半導體裝置之環境檢驗法及耐久性檢驗法-低溫保存 - 英文版
CNS 6124 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Intermittent applying voltage test of
單件半導體裝置之環境檢驗法及耐久性檢驗法-閘流體之 - 英文版
CNS 6802 - English Version
Standard test procedure for noise margin measurements for Semiconductor logic gating microcircuits
半導體邏輯閘微電路雜訊界限之測試程序 - 英文版
CNS 13805 - English Version
Method of measurement for photoluminescence of optoelectronic Semiconductor wafers
光電半導體晶圓之光激光譜量測法 - 英文版
CNS 6127 - English Version
General Rules for Reliability Assured Discrete Semiconductor Devices
可靠度保證單件半導體裝置總則 - 英文版
CNS 5070 - English Version
Environmental testing methods and endurance testing methods for discrete Semiconductor devices (Cycle test for temperature)
單件半導體裝置之環境檢驗法及耐久性檢驗法-溫度循環 - 英文版

Find out:30Items   |  To Page of: First -Previous-Next -Last  | 1

 

1F Zhongmao Building, No.1 Beizhan Road, Luohu District, Shenzhen City, China
+86-755-2583-1330        info@transcustoms.com 
©  Copyright 2001-2018  RJS MedTech Inc. All Rights Reserved