Chinese National Standards -Taiwan
中華民國國家標準 -台灣
Home   CNS Standards Index   CNS Standards Search GB standards of P.R.China Contact Us
Keywords:  Safety   enamel   WH   Healthcare   implements   Non metallic   Saccharified   Employment   weir   Health   impact   Clothing   news   runback   emitting   Mining & Met   WCDMA   headwear   automobiles   Image 
 

"discrete" CNS Standards Search Result

1. Ready translated english version CNS Standards ( SALE mark )  and Chinese version CNS Standards, you can purchase directly in the web page; After receive your payment, we will send the CNS Standards PDF file to your Email within 1~3 days.
2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days .
       
5075 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Test of constant acceleration)
單件半導體裝置之環境檢驗法及耐久性檢驗法-等加速度 - 英文版
6137 - English Version
Color Coding of discrete Semiconductor Devices
個別半導體元件之色碼 - 英文版
6806 - English Version
Type designation system for discrete semiconductor devices
單件半導體裝置之型名 - 英文版
5066 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (General rules)
單件半導體裝置之環境檢驗法及耐久性檢驗法-總則 - 英文版
5067 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Test of soft solders for heat
單件半導體裝置之環境檢驗法及耐久性檢驗法-焊錫耐熱 - 英文版
5069 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Test of thermal shock)
單件半導體裝置之環境檢驗法及耐久性檢驗法-熱衝擊試 - 英文版
5070 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Cycle test for temperature)
單件半導體裝置之環境檢驗法及耐久性檢驗法-溫度循環 - 英文版
5071 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Cycle test for temperature &
單件半導體裝置之環境檢驗法及耐久性檢驗法-溫濕度循 - 英文版
5556 - English Version
Reproducing discrete Four-Signal Disc Records
分離式四聲道唱片訊號之再生 - 英文版
5074 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Test of free fall)
單件半導體裝置之環境檢驗法及耐久性檢驗法-自然落下 - 英文版
6127 - English Version
General Rules for Reliability Assured discrete Semiconductor Devices
可靠度保證單件半導體裝置總則 - 英文版
5076 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Vibration test)
單件半導體裝置之環境檢驗法及耐久性檢驗法-振動試驗 - 英文版
5077 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Test of terminal strength)
單件半導體裝置之環境檢驗法及耐久性檢驗法-端子強度 - 英文版
5078 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Test of salt mist spray)
單件半導體裝置之環境檢驗法及耐久性檢驗法-鹽水噴霧 - 英文版
5539 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Continuous operation test of
單件半導體裝置之環境檢驗法及耐久性檢驗法-穩壓二極 - 英文版
6117 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Damp heat test)
單件半導體裝置之環境檢驗法及耐久性檢驗法-耐濕性試 - 英文版
6118 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Test of storage under low
單件半導體裝置之環境檢驗法及耐久性檢驗法-低溫保存 - 英文版
6124 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Intermittent applying voltage test of
單件半導體裝置之環境檢驗法及耐久性檢驗法-閘流體之 - 英文版
14660-1 - English Version
Acoustics - Determination of sound power levels of noise sources using sound intensity - Part 1: Measurement at discrete points
聲學-利用聲強測定噪音源聲功率位準-第一部:在非連 - 英文版
5073 - English Version
Environmental testing methods and endurance testing methods for discrete semiconductor devices (Shock test)
單件半導體裝置之環境檢驗法及耐久性檢驗法-衝擊試驗 - 英文版

Find out:20Items   |  To Page of: First -Previous-Next -Last  | 1

 

1F Zhongmao Building, No.1 Beizhan Road, Luohu District, Shenzhen City, China
+86-755-2583-1330        info@transcustoms.com 
©  Copyright 2001-2018  RJS MedTech Inc. All Rights Reserved