|
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
|
GB/T 24581-2022
|
|
Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method |
|
|
|
Issued Date: |
|
Implemented Date: |
|
Issued by: |
|
The Standardization Administration of the People's Republic of China |
|
|
|
|
Thanks for your interest in
"GB/T 24581-2022" standard !
This GB standard english version is not ready translated, only after get your order, then we translate it, time usually need more 3-5 days .
|
|
GB Standard Code |
GB/T 24581-2022 |
Standard Category |
China National Standards |
GB Standard English Title |
Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method |
GB Standard Chinese Title |
硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法 |
Chinese Version Price |
$15 USD per 50 pages |
English Translation Fee |
About $15 per 1 page (1,000 words) |
Sale Price
(30~50% off) |
Inquire us for detail price
|
|