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GB/T 4937.4-2012 standards english version


NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 4937.4-2012

 

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

 
Issued Date:  

Implemented Date:

Issued by:   The Standardization Administration of the People's Republic of China
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GB Standard Code GB/T 4937.4-2012
Standard Category China National Standards
GB Standard English Title Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
GB Standard Chinese Title 半导体器件 机械和气候试验方法 第4部分:强加速稳态湿热试验(HAST)
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