“Test method for crys ” 中國GB標準檢索結果 |
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1. 已翻譯的GB標準英文版(有 SALE
標誌的),以及GB標準中文版,可以直接在網站上購買,在收到您付款後,會在1~3天內發您郵箱。 2. 其他未翻譯的GB標準英文版,在接到您翻譯訂單後,才進行翻譯,時間一般需要多3~5天。 |
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GB/T 18910.63-2024 液晶顯示器件-第6-3部分:液晶顯示模塊測試方法-有源矩陣液晶顯示模塊運動僞像(中英文版) Liquid crystal display devices - Part 6-3: Test methods for liquid crystal display modules - Active matrix liquid crystal display =Motion artifacts of display modules |
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GB/T 43726-2024 無刷直流力矩電動機通用技術條件(中英文版) Test methods for single liquid crystals |
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GB/T 24581-2022 矽單晶中III、V族雜質含量的測定 低溫傅立葉變換紅外光譜法(中英文版) Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method |
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GB/T 41765-2022 碳化矽單晶位錯密度的測試方法(中英文版) Test method for dislocation density of silicon carbide single crystal |
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GB/T 41751-2022 氮化镓單晶襯底片晶面曲率半徑測試方法(中英文版) Test method for radius of curvature of crystal surface of gallium nitride single crystal substrate |
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GB/T 1551-2021 矽單晶電阻率的測定 直排四探針法和直流兩探針法(中英文版) Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method |
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GB/T 9966.17-2021 天然石材試驗方法 第17部分:鹽結晶強度的測定(中英文版) Test methods for natural stone-Part 17:Determination of resistance to salt crystallization |
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GB/T 8760-2020 砷化镓單晶位錯密度的測試方法(中英文版) Test method for dislocation density of monocrystal gallium arsenide |
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GB/T 5252-2020 鍺單晶位錯密度的測試方法(中英文版) Test method for dislocation density of monocrystal germanium |
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GB/T 37983-2019 晶體材料X射線衍射儀旋轉定向測試方法(中英文版) Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation |
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GB/T 37240-2018 晶體矽光伏組件蓋闆玻璃透光性能測試評價方法(中英文版) Test and evaluation methods for light transmission property of cover glass for crystalline silicon photovoltaic module |
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GB/T 4059-2018 矽多晶氣氛區熔基磷檢驗方法(中英文版) Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere |
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GB/T 36655-2018 電子封裝用球形二氧化矽微粉中α态晶體二氧化矽含量的測試方法 XRD法(中英文版) Test method for alpha crystalline silicon dioxide content of spherical silica powder for electronic packaging—XRD method |
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GB/T 4060-2018 矽多晶真空區熔基硼檢驗方法(中英文版) Test method for boron content in polycrystalline silicon by vacuum zone-melting method |
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GB/T 34481-2017 低位錯密度鍺單晶片腐蝕坑密度(EPD)的測量方法(中英文版) Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices |
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GB/T 14142-2017 矽外延層晶體完整性檢驗方法 腐蝕法(中英文版) Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique |
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GB/T 34210-2017 藍寶石單晶晶向測定方法(中英文版) Test method for determining the orientation of sapphire single crystal |
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GB/T 33763-2017 藍寶石單晶位錯密度測量方法(中英文版) Test method for dislocation density of sapphire single crystal |
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GB/T 35118-2017 摻铒钇鋁石榴石激光晶體光學性能測量方法(中英文版) Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal |
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GB/T 35306-2017 矽單晶中碳、氧含量的測定 低溫傅立葉變換紅外光譜法(中英文版) Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry |
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GB/T 32278-2015 碳化矽單晶片平整度測試方法(中英文版) Test methods for flatness of monocrystalline silicon carbide wafers |
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GB/T 32282-2015 氮化镓單晶位錯密度的測量 陰極熒光顯微鏡法(中英文版) Test method for disoclation density of GaN single crystal—Cathodoluminescence spectroscopy |
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GB/T 32189-2015 氮化镓單晶襯底表面粗糙度的原子力顯微鏡檢驗法(中英文版) Test method for surface roughness of GaN single crystal substrate by atomic force microscope |
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GB/T 19199-2015 半絕緣砷化镓單晶中碳濃度的紅外吸收測試方法(中英文版) Test method for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy |
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GB/T 17170-2015 半絕緣砷化镓單晶深施主EL2濃度紅外吸收測試方法(中英文版) Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy |
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GB/T 31568-2015 熱噴塗熱障ZrO2塗層晶粒尺寸的測定 謝樂公式法(中英文版) Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation |
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GB/T 31351-2014 碳化矽單晶抛光片微管密度無損檢測方法(中英文版) Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers |
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GB/T 30653-2014 Ⅲ族氮化物外延片結晶質量測試方法(中英文版) Test method for crystal quality of III-nitride epitaxial layers |
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GB/T 31093-2014 藍寶石晶錠應力測試方法(中英文版) Test method for stress of monocrystalline sapphire ingot |
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GB/T 30868-2014 碳化矽單晶片微管密度的測定 化學腐蝕法(中英文版) Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching |
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GB/T 30867-2014 碳化矽單晶片厚度和總厚度變化測試方法(中英文版) Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers |
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GB/T 30866-2014 碳化矽單晶片直徑測試方法(中英文版) Test method for measuring diameter of monocrystalline silicon carbide wafers |
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GB/T 11297.12-2012 光學晶體消光比的測量方法(中英文版) Test method for extinction ratio of optical crystal |
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GB/T 25275-2010 液晶顯示器(LCD)用偏振片 光學性能和耐候性能測試方法(中英文版) Polarizing film for Liquid Crystal Display (LCD) - Method of test for the properties of photics and weather resistance |
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GB/T 24574-2009 矽單晶中Ⅲ-Ⅴ族雜質的光緻發光測試方法(中英文版) Test methods for photoluminescence analysis of single crystal silicon for III-V impurities |
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GB/T 24582-2009 酸浸取 電感耦合等離子質譜儀測定多晶矽表面金屬雜質(中英文版) Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry |
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GB/T 24581-2009 低溫傅立葉變換紅外光譜法測量矽單晶中III、V族雜質含量的測試方法(中英文版) Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities |
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GB/T 24579-2009 酸浸取 原子吸收光譜法測定多晶矽表面金屬污染物(中英文版) Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy |
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GB/T 1555-2009 半導體單晶晶向測定方法(中英文版) Testing methods for determining the orientation of a semiconductor single crystal |
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GB/T 1554-2009 矽晶體完整性化學擇優腐蝕檢驗方法(中英文版) Testing method for crystallographic perfection of silicon by preferential etch techniques |
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GB/T 1551-2009 矽單晶電阻率測定方法(中英文版) Test method for measuring resistivity of monocrystal silicon |
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GB/T 13255.2-2009 工業用己内酰胺試驗方法 第2部分:結晶點的測定(中英文版) Test methods of caprolactam for industrial use - Part 2: Determination of crystallizing point |
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GB/T 7896-2008 人造光學石英晶體試驗方法(中英文版) Test method for optical grade synthetic quartz crystal |
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GB/T 19199-2003 半絕緣砷化镓單晶中碳濃度的紅外吸收測試方法(中英文版) Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method |
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GB/T 17170-1997 非摻雜半絕緣砷化镓單晶深能級EL2濃度紅外吸收測試方法(中英文版) Test method for deep level EL2 concentration of undoped semiinsulating monocrystal gallium arsenide by measurement infra-red absorption method |
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GB/T 16864-1997 低溫下晶體透射率的試驗方法(中英文版) Method for testing cryogenic transmissivityof crystals |
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GB/T 16863-1997 晶體折射率的試驗方法(中英文版) Method for testing refractive index of crystals |
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GB/T 16822-1997 介電晶體介電性能的試驗方法(中英文版) Test method for dielectric properties of dielectric crystal |
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GB/T 14142-1993 矽外延層晶體完整性檢查方法 腐蝕法(中英文版) Test method for crystallographic perfection of epit-axial layers in silicon by etching techniques |
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GB/T 12634-1990 壓電晶體電彈常數測試方法(中英文版) Test methods for electroelastic constants of piezoelectric crystals |
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