China Semiconductor single GB Standards Search Result

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	GB/T 43967-2024 Space environment - single particle effect pulse laser test method for semiconductor devices for aerospace use 空间环境-宇航用半导体器件单粒子效应脉冲激光试验方法 - 中英文版
	GB/T 43226-2023 Single-event soft error time domain testing method for semiconductor integrated circuits used in aerospace applications 宇航用半导体集成电路单粒子软错误时域测试方法 - 中英文版
	GB/T 42676-2023 Testing the quality of Semiconductor single crystals X-ray diffraction method 半导体单晶晶体质量的测试 X射线衍射法 - 中英文版
	GB/T 1555-2023 Semiconductor single crystal crystal orientation determination method 半导体单晶晶向测定方法 - 中英文版
	GB/T 1555-2009 Testing methods for determining the orientation of a Semiconductor single crystal 半导体单晶晶向测定方法 - 中英文版
	GB/T 17574.11-2006 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory 半导体器件集成电路第2-11部分：数字集成电路单电源集成电路电可擦可编程只读存储器空白详细规范 - 中英文版
	GB/T 4326-2006 Extrinsic Semiconductor single crystals measurement of Hall mobility and Hall coefficient 非本征半导体单晶霍尔迁移率和霍尔系数测量方法 - 中英文版
	GB/T 6219-1998 Semiconductor devices--Discrete devices--Part 8:Field-effect transistors--Section One:Blank detail specification for single-gate field-effect transistors up to 5W and 1GHz 半导体器件分立器件第8部分:场效应晶体管第一篇 1 GHz、5 W以下的单栅场效应晶体管空白详细规范 - 中英文版

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