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GB/T 5252-2020 Test method for dislocation density of monocrystal germanium 锗单晶位错密度的测试方法 - 中英文版 |
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GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices 锗单晶和锗单晶片 - 中英文版 |
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GB/T 34481-2017 Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices 低位错密度锗单晶片腐蚀坑密度(EPD)的测量方法 - 中英文版 |
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GB/T 26074-2010 Germanium monocrystal-measurement of resistivity-DC linear four-point probe 锗单晶电阻率直流四探针测量方法 - 中英文版 |
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GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices 锗单晶和锗单晶片 - 中英文版 |
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GB/T 5252-2006 Germanium monocrystal - inspection of dislocation etch pit density 锗单晶位错腐蚀坑密度测量方法 - 中英文版 |
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