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GB/T 5965-2000 Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays) 半导体器件 集成电路 第2部分:数字集成电路 第一篇 双极型单片数字集成电路门电路(不包括自由逻辑阵列) 空白详细规范 - 中英文版 |
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GB/T 17940-2000 Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits 半导体器件 集成电路 第3部分:模拟集成电路 - 中英文版 |
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GB/T 9424-1998 Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Five:Blank detail specification for complementary MOS digital inte-grated circuits，series 4000B and 4000UB 半导体器件 集成电路 第2部分:数字集成电路 第五篇 CMOS数字集成电路4000B和4000UB系列空白详细规范 - 中英文版 |
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GB/T 17574-1998 Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits 半导体器件 集成电路 第2部分:数字集成电路 - 中英文版 |
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GB/T 17573-1998 Semiconductor devices--Discrete devices and integrated circuits--Part 1:General 半导体器件 分立器件和集成电路 第1部分:总则 - 中英文版 |
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GB/T 17572-1998 Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Four:Family specification for complementary MOS digital integrated circuits，series 4000B and 4000UB 半导体器件 集成电路 第2部分:数字集成电路 第四篇 CMOS数字集成电路 4000B和4000UB系列族规范 - 中英文版 |
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GB/T 4023-1997 Semiconductor devices--Discrete devices and integrated circuits--Part 2:Rectifier diodes 半导体器件 分立器件和集成电路 第2部分:整流二极管 - 中英文版 |
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GB/T 17024-1997 Semiconductor devices--integratedcircuits--Part 2:Digital integrated circuits--Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HC，54/74HCT，54/74HCU 半导体器件 集成电路 第2部分:数字集成电路 第三篇 HCMOS数字集成电路54/74HC、54/74HCT、54/74HCU系列空白详细规范 - 中英文版 |
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GB/T 17023-1997 Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section two--Family specification for HCMOS digital integrated circuits series 54/74HC，54/74HCT，54/74HCU 半导体器件 集成电路 第2部分:数字集成电路 第二篇 HCMOS数字集成电路54/74HC、54/74HCT、54/74HCU系列族规范 - 中英文版 |
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GB/T 6798-1996 Semiconductor integrated circuits--General principles of measuring methods of voltage comparators 半导体集成电路 电压比较器测试方法的基本原理 - 中英文版 |
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GB/T 4377-1996 Semiconductor integrated circuits--General principles of measuring methods of voltage regulator 半导体集成电路 电压调整器测试方法的基本原理 - 中英文版 |
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GB/T 3436-1996 Semiconductor integrated circuits--Series and products of operational amplifier 半导体集成电路 运算放大器系列和品种 - 中英文版 |
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GB/T 16464-1996 Semiconductor devices--Integrated circuits--Part 1:General 半导体器件 集成电路 第1部分:总则 - 中英文版 |
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GB/T 15879-1995 Mechanical standardization of semiconductor devices--Part 5:Recommendations applying to tape automated bonding (TAB) of integrated circuits 半导体器件的机械标准化 第5部分:用于集成电路载带自动焊(TAB)的推荐值 - 中英文版 |
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GB/T 15651-1995 Semiconductor devices--Discrete devices and integrated circuits--Part 5:Optoelectronic devices 半导体器件 分立器件和集成电路 第5部分:光电子器件 - 中英文版 |
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GB/T 4587-1994 Semiconductor discrete devices and integrated circuits--Part 7:Bipolar transistors 半导体分立器件和集成电路 第7部分:双极型晶体管 - 中英文版 |
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GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of Semiconductor integrated circuits 半导体集成电路石英钟表电路测试方法的基本原理 - 中英文版 |
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GB/T 14862-1993 Junction-to-case thermal resistance test methods of packages for Semiconductor integrated circuits 半导体集成电路封装结到外壳热阻测试方法 - 中英文版 |
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GB/T 14129-1993 Series and productsfor TTL Semiconductor integrated circuits--Products of series PAL 半导体集成电路TTL电路系列和品种 PAL系列的品种 - 中英文版 |
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GB/T 7092-1993 Outline dimensions of Semiconductor integratedcircuits 半导体集成电路外形尺寸 - 中英文版 |
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GB/T 14115-1993 General principles of measuring methods of Sample/Hold amplifiers for Semiconductor integrated circuits 半导体集成电路采样/保持放大器测试方法的基本原理 - 中英文版 |
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GB/T 14114-1993 General principles of measuring methods of V/F and F/V converters for Semiconductor integrated circuits 半导体集成电路电压/频率和频率/电压转换器测试方法的基本原理 - 中英文版 |
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GB/T 14032-1992 General principles of measuring methods of digital phase-locked loop for Semiconductor integrated circuits 半导体集成电路数字锁相环测试方法的基本原理 - 中英文版 |
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GB/T 14031-1992 General principles of measuring methods of analogue phase-loop for Semiconductor integrated circuits 半导体集成电路模拟锁相环测试方法的基本原理 - 中英文版 |
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GB/T 14030-1992 General principles of measuring methods of timer circuits for Semiconductor integrated circuits 半导体集成电路时基电路测试方法的基本原理 - 中英文版 |
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GB/T 14029-1992 General principles of measuring methods of analogue multiplier for Semiconductor integrated circuits 半导体集成电路模拟乘法器测试方法的基本原理 - 中英文版 |
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GB/T 14028-1992 General principles of measuring methods of analogue switches for Semiconductor integrated circuits 半导体集成电路模拟开关测试方法的基本原理 - 中英文版 |
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GB/T 3430-1989 The rule of type designation for Semiconductor integrated circuits 半导体集成电路型号命名方法 - 中英文版 |
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GB/T 7509-1987 Blank detail specification for microprocessor Semiconductor integrated circuits 半导体集成电路微处理器空白详细规范 (可供认证用) - 中英文版 |
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GB/T 3431.2-1986 Letter symbols for Semiconductor integrated circuits--Letter symbols for function of pins 半导体集成电路文字符号 引出端功能符号 - 中英文版 |
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