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GB/T 28632-2012 Surface Chemical Analysis － Auger electron spectroscopy and X-ray photoelectron spectroscopy － Determination of lateral resolution 表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率测定 - 中英文版 |
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GB/T 25187-2010 Surface Chemical Analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters 表面化学分析 俄歇电子能谱 - 选择仪器性能参数的表述 - 中英文版 |
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GB/T 25186-2010 Surface Chemical Analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials 表面化学分析 二次离子质谱 - 由离子注入参考物质确定相对灵敏度因子 - 中英文版 |
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GB/T 25185-2010 Surface Chemical Analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction 表面化学分析 X射线光电子能谱 - 荷电控制和荷电校正方法的报告 - 中英文版 |
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GB/T 6609.35-2009 Chemical analysis methods and determination of physical performance of alumina - Part 35: Determination of specific surface area by nitrogen adsorption 氧化铝化学分析方法和物理性能测定方法 第35部分：比表面积的测定 氮吸附法 - 中英文版 |
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GB/T 22572-2008 Surface Chemical Analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials 表面化学分析 二次离子质谱 用多δ层参考物质评估深度分辨参数的方法 - 中英文版 |
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GB/T 22571-2008 Surface Chemical Analysis ?X-ray photoelectron spectrometers ?Calibration of energy scales 表面化学分析 X射线光电子能谱仪 能量标尺的校准 - 中英文版 |
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GB/T 22461-2008 Surface Chemical Analysis - Vocabulary 表面化学分析 词汇 - 中英文版 |
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GB/T 21007-2007 Surface Chemical Analysis - Information formats 表面化学分析 信息格式 - 中英文版 |
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GB/T 21006-2007 Surface Chemical Analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale 表面化学分析 X射线光电子能谱仪和俄歇电子能谱仪 强度标的线性 - 中英文版 |
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GB/T 20176-2006 Surface Chemical Analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials 表面化学分析 二次离子质谱 用均匀掺杂物质测定硅中硼的原子浓度 - 中英文版 |
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GB/T 20175-2006 Surface Chemical Analysis-Sputter depth profiling-Optimization using layered systems as reference materials 表面化学分析 溅射深度剖析 用层状膜系为参考物质的优化方法 - 中英文版 |
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GB/T 20176-2006 Surface Chemical Analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials 表面化学分析 二次离子质谱 用均匀掺杂物质测定硅中硼的原子浓度 - 中英文版 |
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GB/T 20175-2006 Surface Chemical Analysis-Sputter depth profiling-Optimization using layered systems as reference materials 表面化学分析 溅射深度剖析 用层状膜系为参考物质的优化方法 - 中英文版 |
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GB/T 19502-2004 Surface Chemical Analysis--Glowdischarge optical emission spectrometry(GD-OES)--Introduction to use 表面化学分析 辉光放电发射光谱方法通则 - 中英文版 |
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GB/T 19499-2004 Surface Chemical Analysis--Data transfer format 表面化学分析 数据传输格式 - 中英文版 |
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