Semiconductor integr standards english version

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 36474-2018

Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)

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Implemented Date:

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The Standardization Administration of the People's Republic of China

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GB Standard Code	GB/T 36474-2018
Standard Category	China National Standards
GB Standard English Title	Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
GB Standard Chinese Title	半导体集成电路第三代双倍数据速率同步动态随机存储器 (DDR3 SDRAM)测试方法
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