Semiconductor device standards english version

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 4937.31-2023

Semiconductor devices - Methods of mechanical and climatic tests - Part 31: Flammability of plastic encapsulated devices (internal origin)

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The Standardization Administration of the People's Republic of China

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GB Standard Code	GB/T 4937.31-2023
Standard Category	China National Standards
GB Standard English Title	Semiconductor devices - Methods of mechanical and climatic tests - Part 31: Flammability of plastic encapsulated devices (internal origin)
GB Standard Chinese Title	半导体器件机械和气候试验方法第31部分：塑封器件的易燃性（内部引起的）
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