China Epitaxial wafers of GB Standards Search Result

and Chinese version GB Standards, you can purchase directly in the web page; After receive your payment, we will send the GB Standards PDF file to your Email within 1~3 days.
2. Other English version GB Standards are not ready translated, only after get your order, then we translate them, time usually need 3-5 days .


	GB/T 43493.3-2023 Semiconductor devices - Non-destructive testing and identification criteria for defects in silicon carbide homoepitaxial wafers for power devices - Part 3: Photoluminescence detection method of defects 半导体器件功率器件用碳化硅同质外延片缺陷的无损检测识别判据第3部分：缺陷的光致发光检测方法 - 英文版
	GB/T 42902-2023 Testing of surface defects of silicon carbide epitaxial wafers Laser scattering method 碳化硅外延片表面缺陷的测试激光散射法 - 英文版
	GB/T 35308-2017 Epitaxial wafers of germanium based Ⅲ-Ⅴcompounds for solar cell 太阳能电池用锗基Ⅲ-Ⅴ族化合物外延片 - 英文版

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